ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The charge distribution in negatively corona-charged Teflon FEP (fluoroethylenepropylene) films was investigated with the laser-induced pressure-pulse method. The 12.7- and 25.4-μm samples were charged to potentials up to −2500 and −4500 V, respectively, and thereafter stored at room temperature. Measurements of the charge distribution were taken at time intervals ranging from 1 min to several days after charging. The results indicate that the corona charge is initially trapped at the surface of the samples. A negative bulk charge which is nonuniformly distributed over the entire volume with a density of ∼1013 e/cm3 is found for samples kept at the highest voltages for periods of the order of hours. Within the resolution of the method, a spatial broadening of the surface-charge layer is not observed. These findings suggest that in highly surface-charged samples shallow-trapped holes in the bulk of the material, which compensate deeply trapped electrons, drift to the charged surface and thus cause the observed net-negative charge in the bulk.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.351127
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