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  • 1990-1994  (3)
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  • 1
    Electronic Resource
    Electronic Resource
    Scanning tunneling microscopy on rough surfaces-quantitative image analysis (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 523-525 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In this communication, the application of scanning tunneling microscopy (STM) for a quantitative evaluation of roughnesses and mean island sizes of polycrystalline thin films is discussed. Provided strong conditions concerning the resolution are satisfied, the results are in good agreement with standard techniques as, for example, transmission electron microscopy. Owing to its high resolution, STM can supply a better characterization of surfaces than established methods, especially concerning the roughness. Microscopic interpretations of surface dependent physical properties thus can be considerably improved by a quantitative analysis of STM images.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.350267
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Scanning tunneling microscopy on rough surfaces: Tip-shape-limited resolution (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 1156-1159 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This paper discusses the reliability of scanning tunneling microscopy (STM) images of mesoscopically rough surfaces. The specific structure of these images represents a convolution between the real surface topography and the shape of the tip. In order to interpret these images quantitatively, the line scans of steep and high steps can be used to obtain an image of the tip itself. This image shows tip radii ranging typically from 5 to 15 nm and cone angles of about 30° over a length of 80 nm, and can in turn be used to recognize the limits of STM resolution on a rough surface: High-resolution transmission electron microscopy cross-section images of Au island films on a Au-Nb double layer are convoluted with the experimentally observed tip shape; the resulting line scans correspond very well with STM graphs of the same samples. Finally an overall criterion for the resolution of the STM on such surfaces is proposed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.345712
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Scanning tunneling microscopy on rough surfaces: Deconvolution of constant current images (1990)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 867-869 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This letter critically discusses the topographical information obtained by scanning tunneling microscopy (STM) on surfaces with a mesoscopic roughness, i.e., in the range of some nm's. In a foregoing publication [J. Appl. Phys. 67, 1156 (1990)], we already treated the evaluation of constant current images based on the knowledge of the real surface and the shape of the tunneling tip ("tip shape limited resolution''). Now we deal with the invers problem: the reconstruction of the real surface topography based on the corresponding STM image and the tip shape, using a simple, straightforward formalism.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.103390
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    Paper (German National Licenses)
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