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  • 1985-1989  (3)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 9 (1987), S. 393-408 
    ISSN: 0392-6737
    Keywords: Electronic properties of specific thin films
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Description / Table of Contents: Riassunto Sono stati realizzati film dia-SiC:H mediante glow-discharge in atmosfera Ar-SiH4-CH4 con differenti rapporti CH4/SiH4. La concentrazione di H nei film è stata determinate usando la reazione di risonanza1H(15N, αγ)12C ed il contenuto di carbonio mediante spettrometria Rutherford-backscattering. Da misure di trasmittanza e riflettanza nella zona UV-visibile-vicino IR sono state ricavate le costanti ottiche, l'indice di rifrazione, la costante dielettrica, il coefficiente di assorbimento e il gap ottico. Un esame delle bande degli spettri vibrazionali dei vari legami CH, CSi e SiH ottenuti mediante misure di trasmissione nell'IR ha fornito un'interpretazione sulla struttura dei film. Sono state anche realizzate misure di conduttività di buio e di fotoconduttività sotto illuminamento di 500 W/m2. I risultati indicano che all'aumentare del contenuto di carbonio l'indice di rifrazione diminuisce sistematicamente per tutte le lunghezze d'onda, il gap ottico aumenta, la conduttività di buio diminuisce e nella configurazione strutturale tendono a prevalere le catene contenenti il carbonio.
    Abstract: Резюме Ъыли осаждены две системы пленокa-SiC:H в атмосфере Ar-SiH4-CH4, чтобы исследовать переменного отношения CH4/SiH4 на физические свойства. Состав пленок определяется с помощью резонансных ядерных реакций и измерений обратного резерфордовского рассеяния. Также определяются оптичззкся щеяь и показатель преломления с помщяю иемерений пронисаемости в видимойультрафиолетовой-близкой инфракрасной области, конфигурацуя связи с помощью измерений инфракрасной проницаемости и удельное сопротивление и фотопроводимость с помошью єлектрических измерений в темноте м при освешении 500 Bt/M2. Полученные результаты покасывают, что с увеличением содержания углерода показатель преомления систематически уменьшается для всех длин волн, єнергетическая щель увеличивается, темновое сопротивление увеличивается, конфигурация связи становится доминирующей за счет углерод-содержащих цепочек и структура становится более разориентировнной.
    Notes: Summary Two sets ofa-SiC:H films were deposited by glow discharge in an Ar-SiH4-CH4 atmosphere to investigate the effect of a variable CH4/SiH4 ratio on the physical properties. The composition of the films was determined by resonant nuclear reaction and by Rutherford backscattering measurements, the optical gap and the index of refraction by transmissivity measurements in the visible-UV-NIR range, the bonding configuration by IR transmissivity measurements and the resistivity and the photo-conductivity by electrical measurements in the dark and under a 500 W/m2 illumination. Results indicate that with increasing carbon content the refractive index decreases systematically over all wavelengths, the energy gap increases, the dark resistivity increases, the bonding configuration becomes dominated by carbon-containing chains and the structure more disordered.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 721-726 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The a-CSiSn alloy produced by rf magnetron sputtering in SiH4, CH4, and Ar atmosphere was studied as a function of the substrate temperature. The composition of the films was determined by elastic recoil detection analysis and by Rutherford backscattering measurements, and the density was then deduced. Results of a study of optical and electrical properties and of the bonding and structure of the films indicate that with the increase of the substrate temperature, the density and the imaginary part of the dielectric constant increases, the optical gap decreases, and the dark conductivity presents a different conduction mechanism depending on the substrate temperature. A correlation between the results obtained from nuclear measurements and IR spectroscopy is presented.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 59 (1986), S. 2643-2649 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This paper reports the results of structural analysis of proton-exchanged lithium niobate optical waveguides fabricated in Z-, X-, and Y-cut substrates immersed in pure benzoic acid. Rutherford backscattering spectrometry, nuclear reactions, secondary ion mass spectrometry, scanning electron microscopy, and x-ray diffraction were used to measure atomic composition profiles and the marked lattice distortion induced by the proton exchange process in the waveguiding layer. H and Li concentration measurements indicate an exchange of about 70% of the Li atoms are present in the virgin LiNbO3 crystal.
    Type of Medium: Electronic Resource
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