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  • 1970-1974  (8)
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 30 (1974), S. 297-298 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Changes are advocated in some of the definitions, units and notation current in electron diffraction. The purpose of those changes is to separate descriptions of properties of materials from the experiments intended to measure them, and to exhibit as clearly as possible the relationship between the differing properties of a material accessible in X-ray and electron work.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 30 (1974), S. 302-302 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Corrections are given to Anstis, Lynch, Moodie & O'Keefe [Acta Cryst. (1973). A29, 138-147].
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 30 (1974), S. 280-290 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A method for the numerical evaluation of N-beam diffraction amplitudes and intensities which has been successfully employed over the last few years is described. This derives from the multi-slice formulation of Cowley and Moodie. The physical basis of the method and practical approaches to calculation are described.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 28 (1972), S. 528-536 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A series of through-focus lattice images has been obtained with an electron microscope for single crystals of W4Nb26O77 set at an orientation to give mainly a systematic set of 00l reflexions. Dynamical n-beam computations (n = 435) have been made for a crystal in this orientation to determine the values of the amplitudes and phases of the diffracted beams. Subsequently, the fringe profiles for lattice images have been computed for various thicknesses of crystal and defects of focus. When the experimental factors, including instrument aberrations, are taken into account, good agreement between computed and observed fringes is obtained. An earlier assumption of direct correlation of features in underfocused images with structure in the crystal, is found to be valid, at least for this compound.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 26 (1970), S. 152-153 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: In the BJR theory of electron diffraction an absorption effect due to weak beams is introduced into the two-beam approximation for the dynamical diffraction of electrons by thick crystals. This is shown to be unjustified for diffraction from perfect crystals. The use of the theory to derive the temperature dependence of diffraction intensities must therefore be modified.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 29 (1973), S. 138-147 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The scattering factor for electrons is sensitive to differences in atomic bonding at low values of sin θ/λ. These differences will influence the amplitudes and phases of low-order beams of electrons diffracted from crystals with large unit cells. The experimental intensities of these beams, and contrast in the corresponding lattice images, can be used to derive upper limits for the charges on constituent ions, provided the associated n-beam dynamical calculations are carried out with sufficient precision. It is shown that, in W4Nb26O77, the atoms can be only partially ionized, and the bonding must have some covalent character.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 30 (1974), S. 298-298 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Corrections are given to Allpress, Hewatt, Moodie & Sanders [Acta Cryst. (1972). A28, 528-536].
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 7 (1972), S. 909-918 
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract In bonding ceramic oxides to metals, two reaction mechanisms have been utilized. These are (1) a surface or microscopic reaction, between close-packed ceramic oxides, quartz, and glasses and the noble metals (e.g. Pt, Pd, Au, Ag), maintaining a sharp discontinuity at the interface, (2) a bulk or macroscopic reaction between the same oxides and other transition metals (e.g. Fe, Co, Ni) producing a diffusional type interface. Both have common reaction conditions and occur: (a) below the melting point of the lowest melting component, (b) in any atmosphere compatible with all components at the operating temperature, (c) under little or no pressure, and (d) without deformation. The progress of several Type 1 reactions has been followed by direct observation at elevated temperatures and high resolution in a modified transmission electron microscope. It has thereby been established that this reaction proceeds with the formation of an intermediate phase, liquid-like at temperatures below the melting point of any of the components. Bonds have also been examined using electron scanning microscopy, electron probe microanalysis, and optical microscopy. Vacuum tight bonds can be produced and shear tests indicate that strength is generally limited by the strength of oxide components.
    Type of Medium: Electronic Resource
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