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  • 1
    Electronic Resource
    Electronic Resource
    Synthesis and reactions of .alpha.-methylene-.beta.-keto sulfones (1991)
    s.l. : American Chemical Society
    The @journal of organic chemistry 56 (1991), S. 4098-4112 
    Details
    ISSN: 1520-6904
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/jo00013a007
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  • 2
    Electronic Resource
    Electronic Resource
    Anomalous behavior of micellar solutions in electric birefringence measurements (1990)
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 94 (1990), S. 2027-2033 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/j100368a056
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  • 3
    Electronic Resource
    Electronic Resource
    The perpendicular anisotropy of multilayered Fe/Tb films (abstract) : The 5th Joint MMM−Intermag Conference (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 6230-6230 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Multilayer Fe/Tb films were produced by rf sputtering. The thickness ratio of the Fe and Tb single layers was chosen in such kind to give an overall concentration of about 20 at. % Tb. Homogenous amorphous films of such a composition are well known for their perpendicular anisotropy. The investigations in the magnetic properties revealed that the multilayer films showed perpendicular anisotropy much stronger than the homogenous amorphous films. The maximum of the perpendicular anisotropy was found for multilayers with thickness combination of the single layers tFe=1.0 nm, tTb=1.5 nm. The perpendicular anisotropy increases strongly with increasing substrate temperature during rf sputtering. From the results of VSM measurements of the magnetic moment of the samples we must conclude that the Tb single layers are magnetically ordered even at room temperature. The magnetic moment of the Tb film is antiparallel coupled to the moment of the Fe film. The range of the coupling is at least 2 nm. As long as the multilayer films with various thicknesses of the single layers show perpendicular anisotropy, this anisotropy is rather independent of the thickness of the Tb layers but shows a linear dependence of the reciprocal of the thickness of the Fe layers. The magnetic investigations were accompanied by structural investigations. X-ray diffraction shows very clearly the superlattice of the multilayer films. Observations of cross sections of the multilayers by high-resolution electron microscopy revealed very sharp interfaces between Fe and Tb. The Tb films are crystallographically well ordered, whilst the Fe films showed only a nanocrystalline order. Mösbauer investigations are carried out to give an insight in the influence of the Tb films on the hyperfine field at the Fe atoms.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.350004
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  • 4
    Electronic Resource
    Electronic Resource
    Micromagnetic structure of domains in Co/Pt multilayers. I. Investigations of wall structure (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 7431-7437 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An analysis of the micromagnetic structure of domains and domain walls in Co/Pt multilayer films is reported. Magneto-optically written domains have been imaged in a scanning transmission electron microscope by using the modified differential phase contrast mode of Lorentz electron microscopy. These have been compared with computer-simulated images based on a two-dimensional model of a circular, perpendicular magnetized domain with a Bloch-like wall structure. Agreement is found for the domain and stray field contrast, but the absence of wall contrast in the experimental images indicates a more complex wall structure in the multilayer than was assumed by the model. In a further series of calculations the magnetic microstructure of a Co/Pt multilayer was modeled by solving the Landau–Lifshitz–Gilbert equations. These suggest that the wall structure varies throughout the thickness of the multilayer, allowing significant saving of magnetostatic energy through the establishment of flux closure paths close to the walls, and are consistent with experimental observations.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.354964
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  • 5
    Electronic Resource
    Electronic Resource
    Micromagnetic structure of domains in Co/Pt multilayers. II. Investigations of domain structures in written marks (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 7438-7442 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An analysis is presented of the detailed effects of varying the write parameters in Co/Pt multilayer films. Domains written thermomagnetically by laser modulation have been imaged using the modified differential phase contrast mode of Lorentz electron microscopy. The effects of different laser powers and bias fields were investigated. While the domain size increases with laser power, the bias field is found to have a profound effect on domain regularity. The periodicity of the irregular circumference of the domains written at high-bias fields closely resembles the mean repeat in the ac-demagnetized state suggesting that it arises as a relaxation phenomenon.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.354965
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  • 6
    Electronic Resource
    Electronic Resource
    Investigation of the micromagnetic structure of cross-tie walls in permalloy (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 2447-2452 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The modified differential phase contrast (MDPC) mode of Lorentz electron microscopy was used to study the micromagnetic structure of cross-tie walls in permalloy. The distribution of magnetic induction along these walls is characterized and studied in detail by vector mappings calculated from MDPC image pairs. The wall thickness of the cross-tie wall is determined by fitting the calculated image signal of an analytical function to the MDPC wall profiles. A pronounced dip in the wall width is found at the center of the vortex structure of the cross-tie wall. The results are compared to theoretical calculations by Nakatani, Uesaka, and Hayashi, Jpn. J. Appl. Phys. 28, 2485 (1989).
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.353102
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  • 7
    Electronic Resource
    Electronic Resource
    Diffusion barrier properties of Ti/TiN investigated by transmission electron microscopy (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 2127-2132 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Detailed analytical transmission electron microscopy investigations were performed on a well-known diffusion barrier system for very-large-scale integration metallization. It will be demonstrated that interfacial reactions are of great importance for the barrier mechanism. Both Ti and TiN act as diffusion barrier for the semiconductor and the metallization, respectively. For an aluminum-based metallization, TiN has a "spongelike'' function due to its ability to absorb several amounts of aluminum at elevated temperatures and therefore inhibits diffusion towards the substrate. Ti acts for silicon as a compound forming barrier according to Nicolet's classification [in Tungsten and Other Refractory Metals for Very Large Scale Integration Applications II, edited by E. K. Broadbent (Materials Research Society, Pittsburgh, 1987); pp. 19–26].
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.346568
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  • 8
    Electronic Resource
    Electronic Resource
    Dependence of giant magnetoresistance in Co/Cu multilayers on the thickness of the Co layers : The 6th joint magnetism and magnetic materials (MMM)-intermag conference (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 6507-6509 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The dependence of the giant magnetoresistance (GMR) on the thickness of the Co layers in Co/Cu multilayers was investigated experimentally. The thickness of the Cu layer was held constant at tCu=19 A(ring), which corresponds to the second maximum of the GMR ratio oscillating dependence on tCu. The Co layer thickness was varied from 4.8 to 79.0 A(ring). High resolution transmission electron microscopy showed the existence of the two-dimensional artificial superstructure with defined periodicity as well as sharp and flat interfaces. From wide angle x-ray diffraction it was concluded that at Co layer thickness below 40 A(ring) the multilayers are polycrystalline with mainly fcc lattice structure and (111) texture. In the case of thicker Co layers indications of hcp Co could be found. The GMR ratio reaches a maximum at Co layer thickness about 11 A(ring). It was shown that the GMR in sputtered Co/Cu multilayers is due to spin scattering at the interfaces and resistance is strongly influenced by interface scattering.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358244
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  • 9
    Electronic Resource
    Electronic Resource
    Scanning tunneling microscopy on rough surfaces: Deconvolution of constant current images (1990)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 867-869 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This letter critically discusses the topographical information obtained by scanning tunneling microscopy (STM) on surfaces with a mesoscopic roughness, i.e., in the range of some nm's. In a foregoing publication [J. Appl. Phys. 67, 1156 (1990)], we already treated the evaluation of constant current images based on the knowledge of the real surface and the shape of the tunneling tip ("tip shape limited resolution''). Now we deal with the invers problem: the reconstruction of the real surface topography based on the corresponding STM image and the tip shape, using a simple, straightforward formalism.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.103390
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  • 10
    Electronic Resource
    Electronic Resource
    Interaction of ABA block copolymers with ionic surfactants in aqueous solution (1994)
    s.l. : American Chemical Society
    Langmuir 10 (1994), S. 86-91 
    Details
    ISSN: 1520-5827
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/la00013a013
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