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  • Chemistry  (3)
  • 23.20.Ck  (1)
  • 27.70.+q  (1)
  • 1
    Digitale Medien
    Digitale Medien
    High-spin isomers in W and Os nuclei; Competition betweenK-quantization and triaxiality (1985)
    Springer
    The European physical journal 321 (1985), S. 567-575 
    Details
    ISSN: 1434-601X
    Schlagwort(e): 21.10.Re ; 21.10.Gv ; 23.20.Ck ; 27.70.+q
    Quelle: Springer Online Journal Archives 1860-2000
    Thema: Physik
    Notizen: Abstract Results of a search for high-spin isomers in W and Os nuclei withN=104–107 are presented. Targets of48Ca and48, 50Ti are bombarded with a pulsed136Xe beam, and delayed gamma-radiation is detected by an array of NaI- and Ge-detectors. Several new isomers, with spin values up to ∼22h, are found in178,180W and180, 182, 183Os. Markedly different decay patterns and hindrance factors are found in the Os isotopes as compared to the expectations based on theK-selection rule valid for axially symmetric nuclei. The findings are ascribed to the onset of triaxial distortions.
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1007/BF01432431
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  • 2
    Digitale Medien
    Digitale Medien
    Analytical background correction in numerical Fourier transform procedures. Application to electron spectroscopy (1995)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 23 (1995), S. 717-722 
    Details
    ISSN: 0142-2421
    Schlagwort(e): Chemistry ; Polymer and Materials Science
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Notizen: An analytical correction method is proposed to eliminate the problems resulting from numerical Fourier transformation of functions with a broad background. The method incorporates the analytically known or observed asymptotic behaviour into the numerical procedure. The applicability and high accuracy of the background correction method is illustrated by application to the analysis of reflected electron energy-loss spectra.
    Zusätzliches Material: 5 Ill.
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1002/sia.740231011
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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  • 3
    Digitale Medien
    Digitale Medien
    Estimation of depth profiles from inelastic backgrounds in XPS. I. General relationships (1995)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 23 (1995), S. 753-763 
    Details
    ISSN: 0142-2421
    Schlagwort(e): Chemistry ; Polymer and Materials Science
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Notizen: The accuracy by which an unknown concentration profile can be found by analysis of XPS spectra is investigated theoretically by analytical and numerical techniques. The problem of determining the profile is reformulated as an optimization problem. By use of analytical techniques we obtain qualitative statements about the depth resolution and we derive fundamental relationships between the different parameters that indicate their relative importance. In order to illustrate the various dependencies of the variability of the model parameters, we derive analytical expressions for the standard errors of the model parameters for two simple models: a dalta layer and an exponentially decreasing profile. Furthermore, the complete probability distribution of the model parameters for a rectangular model is investigated numerically.
    Zusätzliches Material: 5 Ill.
    Materialart: Digitale Medien
    URL: http://dx.doi.org/10.1002/sia.740231104
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  • 4
    Digitale Medien
    Digitale Medien
    Enhanced Resolution of Depth Profiles Using Two-dimensional XPS Data (1996)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 23-27 
    Details
    ISSN: 0142-2421
    Schlagwort(e): Chemistry ; Polymer and Materials Science
    Quelle: Wiley InterScience Backfile Collection 1832-2000
    Thema: Physik
    Notizen: It is shown that the accuracy by which a concentration-depth profile can be estimated from the inelastic background of an XPS spectrum is dramatically improved by using two-dimensional (2D) data. The energy loss distribution of the photoelectrons for several values of the detection angle, or the energy of the excitation source, are treated as a single 2D data set. The resolution of the depth profile estimated from this set is far better than can be obtained from any single XPS spectrum.
    Zusätzliches Material: 4 Ill.
    Materialart: Digitale Medien
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