ISSN:
0142-2421
Schlagwort(e):
x-ray absorption spectroscopy
;
total electron yield
;
oxides
;
EXAFS probing depth
;
Chemistry
;
Polymer and Materials Science
Quelle:
Wiley InterScience Backfile Collection 1832-2000
Thema:
Physik
Notizen:
Calibration of the probing depth by x-ray absorption spectroscopy (XAS) in oxide materials is intended by measurement of the total electron yield (TEY) of electrons ejected by absorption of the radiation. Measurements have been carried out for three series of electrolytic metal oxide overlayers with different thickness. The experiments have been conducted at the Ti K, Ta LIII and Zr K edges. Analysis of the XAS spectra is carried out by factor analysis and conventional Fourier transformation and fitting analysis. The data showed that the information depth by XAS follows the order ZrO2〉TiO2〉Ta2O5 at the Ti K, Ta LIII and Zr K edges.As an alternative, the absorption spectra of the same samples were measured in the conversion electron yield (CEY) mode: i.e. by measuring the current of He+ ions produced by the ejected electrons in an atmosphere of He in contact with the sample. Here, the information depth is slightly different from that obtained by TEY. © 1997 by John Wiley & Sons, Ltd.
Zusätzliches Material:
8 Ill.
Materialart:
Digitale Medien
Permalink
