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  • Articles: DFG German National Licenses  (29)
Source
  • Articles: DFG German National Licenses  (29)
Material
Years
  • 1
    Electronic Resource
    Electronic Resource
    Tunneling stabilized, magnetic force microscopy with a gold-coated, nickel-film tipa) (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 520-522 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Tunneling stabilized magnetic force microscopy (TSMFM) is done with a scanning tunneling microscope having a flexible magnetic tip. TSMFM can be used to generate maps of magnetic records with submicrometer resolution. We find that Au-coated, Ni-film tips made from a free-standing 0.5-μm-thick Ni film can be used as a noninvasive probe for imaging magnetic bit patterns on the surfaces of computer hard and floppy disks, and computer tape. This variant of scanning tunneling microscopy shows promise as a viable tool for diagnostic use in the magnetic recording industry.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.350266
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Microcantilever torque magnetometry of thin magnetic films (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 5995-5997 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have developed a microcantilever torque magnetometer based on a torsion-mode atomic force microscope. Thin magnetic films are deposited directly onto micromachined silicon cantilevers. We have measured hysteresis loops of iron thin films with thicknesses ranging from 1 to 40 nm and total magnetic volumes ranging from 2.2×10−11 to 8.8×10−10 cm3. The magnetic moment sensitivity is estimated to be 1.3×10−12 A m2/Hz1/2 at room temperature and ambient conditions. We expect that by operating at the cantilever torsion resonance frequency and at higher torque fields sensitivity will be improved by a factor of 100–1000.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372591
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Micromechanical detectors for local field measurements based on ferromagnetic resonance (invited) (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 7086-7090 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ferromagnetic resonance (FMR) measurements were performed on micrometer-size thin-film samples deposited onto a micromechanical cantilever detector. The FMR response is coupled to cantilever motion in one of three ways: (1) By measuring the change in torque on the sample in a uniform field; the FMR precession reduces the static magnetic moment of the sample with a resultant change in torque. (2) By measuring the damping torque acting on the FMR precession. (3) By measuring the energy absorbed in FMR using a bimaterial cantilever as a calorimeter sensor. Our instrument is capable of measuring the FMR response in permalloy samples as small as 2×10−11 cm3 in ambient conditions with a signal-to-noise ratio of 100. In addition we demonstrate that this system can be used as a quantitative scanning probe magnetic field microscope. Using the magnetic field sensitivity of the FMR response in a small ferromagnetic particle, we have achieved 50 A/m field resolution on 20 μm length scales. Both dc fields and microwave fields were imaged. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1354583
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Field mapping with the magnetic resonance force microscope (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 664-670 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have developed magnetic resonance force microscopy for quantitative measurements of magnetic fields. A microscopic particle attached near the end of a microcantilever serves as the field sensing probe. We have demonstrated two-dimensional field mapping with a lateral resolution of 3.2 μm and a field resolution of 0.19 mT (1.9 G). The instrument holds considerable promise for field mapping with spatial resolution better than 0.1 μm at room temperature. Applications include field mapping of magnetic recording heads. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.370781
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    Superparamagnetic magnetic force microscopy tips : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 6448-6450 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report on magnetic force microscopy (MFM) images of a thin-film magnetic recording head taken using batch micromachined silicon tips coated with nanocomposite Fe60(SiO2)40 and Fe70(SiO2)30 films. The small Fe grain size (〈10 nm) and dilute Fe volume fraction (0.29–0.4) of these granular films produce tip coatings of low remanence and essentially zero coercivity, reduced by the superparamagnetic properties of these films. We have used these tips to obtain MFM images of the write field of the head with high spatial and magnetic-field resolution. In comparison to images taken using commercial Co85Cr15-coated tips, these MFM images show reduced tip memory effects and clearly delineate the gap field from the pole pieces. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361969
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    Paper (German National Licenses)
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  • 6
    Electronic Resource
    Electronic Resource
    dc magnetic force microscopy imaging of thin-film recording head : 38th Annual Conference on Magnetism and Magnetic Materials (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 6878-6880 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using a new form of magnetic force microscope (dc MFM) magnetic force images of a thin-film recording head have been made. Using dc MFM, atomic force microscope images are presented of the surface topography and magnetic forces taken simultaneously, allowing direct correlation of magnetic fields to the pole pieces. Magnetic force images of the head at typical head-to-disk spacings are presented. The tips used for these images had two different magnetic coatings.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.356978
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    Paper (German National Licenses)
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  • 7
    Electronic Resource
    Electronic Resource
    High-resolution, tunneling-stabilized magnetic imaging and recording (1990)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 310-312 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have used a scanning tunneling microscope (STM) to record and image magnetic regions on the surface of a hard disk. The usual rigid STM tip was replaced by a compliant magnetized Fe film tip. As a result, tunneling images were combinations of the surface topography and variations in the magnetic force between the Fe film tip and the disk surface. We believe that the recording process relied on maintaining the proximity of the magnetized Fe film tip near the disk surface. Apparently, the magnetic field was focused near the Fe film tip with sufficient intensity to change the surface magnetization of the disk. We have recorded spots on the disk within a 500 nm×500 nm area. These spots were subsequently imaged with the same STM tip. Our best magnetic image resolution was 20 nm. The compliance of the Fe film tips was such that image contrast due to variation of the magnetic force on the tip corresponded to z motions of the piezoelectric translator as large as 50 nm.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.103676
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    Paper (German National Licenses)
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  • 8
    Electronic Resource
    Electronic Resource
    Evidence for the superconducting proximity effect in junctions between the surfaces of YBa2Cu3Ox thin films (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 1477-1479 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have used the squeezable electron tunneling junction technique for testing the electrical properties of the surfaces of YBa2Cu3Ox (YBCO) thin-film electrodes. As deposited and annealed, the surfaces of the electrodes were insulating at 4 K. Several methods were used to improve the electrical properties of the electrodes' surfaces including rapid thermal annealing, oxygen sputter etching, and thin Ag coating treatments. The greatest improvement occurred after a deposition of a 5 nm Ag coating and subsequent rapid thermal anneal of one set of YBCO films. Under these conditions it was possible to make a superconducting Josephson point contact between the surfaces of the electrodes. We think that the Ag acts as a normal-metal proximity layer effectively shunting the degraded electrodes' surfaces.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.101409
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    Paper (German National Licenses)
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  • 9
    Electronic Resource
    Electronic Resource
    Break junction measurement of the tunneling gap of a thallium-based high-temperature superconductor crystal (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 1463-1465 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have used the break junction method to measure the tunneling gap of a thallium-based high-temperature superconductor crystal in liquid helium at 4 K. The crystal was predominantly Tl2CaBa2Cu2O7 and had a superconducting onset temperature of 105 K. Tunneling data showed a symmetric gap about zero bias between two well-defined conductance peaks in the conductance versus voltage curve. The gap is consistent with a Bardeen–Cooper–Schrieffer energy gap (Δ) of 30 meV assuming a superconductor-insulator-superconductor electrode configuration. In addition, a supercurrent could be detected when the break junction was operated in a point-contact mode at temperatures as high as 95 K.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.102286
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    Paper (German National Licenses)
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  • 10
    Electronic Resource
    Electronic Resource
    Josephson effect above 77 K in a YBaCuO break junction (1987)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 51 (1987), S. 540-541 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have observed the Josephson effect in a YBaCuO break junction. Critical currents as high as 10 mA were measured at 4 K for break junctions with a point contact within the fracture of a sample. The junction was susceptible to microwave radiation showing Shapiro steps with the ratio of V/f of 2.04±0.05 μV/GHz compared to the pair tunneling value of h/2e=2.068 μV/GHz. These steps were clearly visible in the current-voltage characteristics at tempertures up to 85±5 K.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.98392
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