ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The optical theory of Fabry-Perot interferometers (FPIs) for x rays using dynamically diffracting thin perfect crystals as reflectors is developed. Application to a device using high diffraction orders in silicon crystals of thickness of the order of 100 μm or more shows that energy resolutions of the order of a tenth of a meV are achievable. The effect that various features, such as gap and mirror thickness, lattice mismatches, etc., have on the FPI resonances is studied. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1147321
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