Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
12 (1979), S. 134-134
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
A computer program has been written for the evaluation of integrated intensities from X-ray diffractometer data. It has been compiled for IBM 360/65 and HP 2100A. The Lehmann–Larsen profile-analysis method [Lehmann & Larsen (1974). Acta Cryst. A30, 580–584] has been used. For weak reflections, profiles obtained from well defined, neighbouring reflections are employed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889879011973
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