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Profile analysis of diffractometer data (1979)

Lindqvist, O. ; Ljungström, E.

Copenhagen : International Union of Crystallography (IUCr)

Applied crystallography online 12 (1979), S. 134-134

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ISSN: 1600-5767

Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Topics: Geosciences , Physics

Notes: A computer program has been written for the evaluation of integrated intensities from X-ray diffractometer data. It has been compiled for IBM 360/65 and HP 2100A. The Lehmann–Larsen profile-analysis method [Lehmann & Larsen (1974). Acta Cryst. A30, 580–584] has been used. For weak reflections, profiles obtained from well defined, neighbouring reflections are employed.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1107/S0021889879011973

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