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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Industrial & engineering chemistry 59 (1967), S. 30-36 
    ISSN: 1520-5045
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Industrial and engineering chemistry 3 (1964), S. 94-98 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Industrial and engineering chemistry 3 (1964), S. 324-328 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 3227-3232 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have developed a design method to produce laterally graded multilayer x-ray mirrors based on sputter deposition techniques. The optimization of all relevant parameters yields an ab initio estimation of any layer gradient suitable to achieve precise x-ray focusing devices. The performance and the accuracy of this method are demonstrated. A graded W/B4C multilayer was deposited on a flat substrate that was bent to a parabola. The obtained nonlinear lateral gradient differed from the theoretical calculations by less than 1%. Focusing experiments performed at an x-ray energy of 8 keV on the ESRF optics beamline revealed an excellent performance with a focal spot size of about 7 μm. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 65 (1989), S. 4250-4255 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Results are presented from a glancing angle extended x-ray absorption fine structure study to investigate the structure of W/C multilayers and the effects of moderate annealing. There is evidence of considerable interlayer mixing prior to any heat treatment. It is found that after annealing to 350 °C for several hours, drastic changes can occur in the structural environment of the W atoms, with minimal changes in the reflectivity of the sample. There is extensive formation of W2C depending on the W thickness and the W/C ratio. Identification of this carbide as the product of annealing is unambiguous. Above a critical thickness, W begins to grow in its bcc form within the W layer, as it is prepared. This bcc layer is unaffected by the annealing process. The presence of carbon is shown to stabilize the amorphous state of W and inhibits any formation of W2C when the W thickness and W/C ratio are small.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 5146-5154 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The thermal behavior of X/C multilayers (nanometer-thick layers made of tungsten, nickel, or SiWSi alternating with carbide or pure carbon) was studied. Two types of annealing were performed: the pulsed laser annealing in air and the classical thermal annealing in a vacuum furnace. Depending on the composition and the structure of the layered materials, thermal stability or diffusion mechanisms were observed and further analyzed by small-angle x-ray scattering, transmission electron microscopy, and Auger electron spectroscopy. The results show that the period expansion and the reflectivity evolution, that were observed in some cases after treatment, are caused both by structural changes into the layers and by exchange of matter between layers. These changes always induce a partial graphitization of the amorphous carbon and, in the case of W/C multilayers, the formation of a W2C compound.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 248-254 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Fe/C multilayers have been deposited by rf sputtering on two silicon substrates with a significant difference in surface quality. Scanning tunneling microscopy (STM) shows a roughness replication process: the smoother the substrate, the smoother the final surface. Both samples present a Gaussian height distribution. The fractal analysis of the STM data shows that, for dimensions larger than the grain size, the surface can be described as a self-affine fractal with a fractal dimension of 2.6±0.1, which agrees with the prediction of ballistic deposition models without restructuring. For dimensions lower than the grain size, the fractal dimension is close to the Euclidean value 2.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 168-174 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The effect of thermal annealing and irradiation in an intense white synchrotron x-ray beam on the x-ray reflectance of tungsten/carbon and tungsten/silicon multilayers is reported. Thermal annealing at 400 °C for two hours produces larger effects than irradiation of cooled multilayers in the white beam of a 20-pole hard x-ray wiggler with 0.94-T peak field on the storage ring DORIS operating at 5.42 GeV and electron currents of 20–36 mA for 40 h. Thermal annealing caused the period and first order reflectance of a W/Si sample to decrease, in contrast to a W/C sample whose period and reflectance increased on annealing. Of five actively cooled samples irradiated, one W/C sample showed significant change in reflectance. Preannealing of this multilayer stabilized it to radiation-induced changes. Irradiation effects also depend on multilayer period and constituent materials. Implications of these results for models describing multilayer reflectance and for multilayer applications in the new generation of synchrotron radiation sources are discussed.
    Type of Medium: Electronic Resource
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  • 9
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Present-day synchrotron x-ray beams are very demanding in terms of thermal, mechanical, and radiation stability of any optical element to be inserted in the beam. A set of multilayers was recently exposed and could resist to an x-ray power density in excess of 7.5 W/mm2, which is comparable to the one expected for the multilayers to be used at ESRF. Such a power density was obtained by setting the multilayers at a grazing angle of about 2° in a focused wiggler beam of 4.6 keV critical energy. The specimen, W/B4C and W/Si multilayers, were cooled either at room temperature or down to liquid nitrogen temperature during an 8–16 h exposure time.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3356-3356 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: In the last decades, the major motivation for manufacturing multilayer mirrors has been in soft x-ray applications, particularly for astronomy, microlithography, and polarimetry. The advent of high energy synchrotron storage rings has provided a new significant impetus emphasizing high energy applications and especially when flux, rather than resolution, is desired. In this paper we present the reflection properties of the most promising multilayer material combinations for the energy range from 0.1 keV up to 200 keV. Previous calculations by Rosenbluth were limited to a maximum of 2 keV and to multilayers composed of pure elements and operating under normal incidence. As alloys might be essential for a smooth growth and/or for stability under high heat load, our screening consisted of a list of up to 300 solids having a melting point above 100°C and that could be deposited in a sputtering process. A full computer search calculates 45000 multilayer combinations for each angle (or multilayer d-spacing) and energy of operation, the only necessary input variables. Other manufacture-related parameters can be specified to give a more realistic picture of the performance. As the number of layers is often limited, a nonperiodic design could minimize absorption effects. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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