Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
67 (1995), S. 2872-2874
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Josephson junctions were fabricated at the interface of YBa2Cu3O7−x (YBCO) and Nd1.85Ce0.15CuO4−y (NCCO) in heteroepitaxially grown superconducting bilayers. Devices of various configurations and sizes were fabricated, and they display a resistively shunted junction like I–V characteristics with hysteresis at low temperatures. A clear ac Josephson effect was observed under microwave irradiation, and critical currents were completely suppressible by external magnetic fields. Oxygen diffusion or charge diffusion at the interface are possible origins for the barrier formation. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.114813
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