Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
67 (1995), S. 1929-1931
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We have performed a detailed analysis of the low frequency 1/f noise in YBa2Cu3O7−δ and Bi2Sr2CaCu2O8+x grain boundary Josephson junctions (GBJs) fabricated on SrTiO3 bicrystal substrates. The normalized fluctuation of the critical current, δIc/Ic, and the normal resistance, δRn/Rn were found to be almost independent of temperature and the misorientation angle. Furthermore, the magnitude of the fluctuations is very similar for both high-Tc cuprates. Correlation experiments showed that the fluctuations of Ic and Rn are anti-correlated. Our analysis strongly suggests that the source of 1/f noise in high-Tc bicrystal GBJs are localized defect states in an insulating grain boundary barrier with fluctuating electron occupation. The effective charge trapping time within single traps was found to decay exponentially with increasing bias voltage. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.114571
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