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Microcantilever torque magnetometry of thin magnetic films (2000)

Löhndorf, Markus ; Moreland, John ; Kabos, Pavel ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 87 (2000), S. 5995-5997

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: We have developed a microcantilever torque magnetometer based on a torsion-mode atomic force microscope. Thin magnetic films are deposited directly onto micromachined silicon cantilevers. We have measured hysteresis loops of iron thin films with thicknesses ranging from 1 to 40 nm and total magnetic volumes ranging from 2.2×10−11 to 8.8×10−10 cm3. The magnetic moment sensitivity is estimated to be 1.3×10−12 A m2/Hz1/2 at room temperature and ambient conditions. We expect that by operating at the cantilever torsion resonance frequency and at higher torque fields sensitivity will be improved by a factor of 100–1000.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.372591

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