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  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 33-37 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The use of peak-to-background ratios has been suggested for the analysis of particles or rough surfaces as the peak-to-background ratio is assumed to be independent of geometry. The validity of this assumption is examined for flat specimens. It is shown that the peak-to-background ratio does not vary much with sample orientation but does vary with voltage, tending to a limit at high voltages. Methods of analysis using the peak-to-background ratio are proposed and the effects of fluorescence are discussed.
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
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