ISSN:
1063-7826
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract The laser scanning technique was used to obtain two-and three-dimensional optoelectronic images of polycrystalline solar cells based on thin films of CuInSe2 and CuInGaSe2. Topograms obtained with the aid of the laser-beam-induced current reveal microregions with reduced photovoltaic efficiency and provide a detailed picture of the distribution of hidden inhomogeneities over the entire active surface of the solar cell. Gradation of the microdefects with intensity and size was achieved by post-experimental graphic and false-color processing of the obtained three-dimensional images.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1134/1.1187835