ISSN:
1600-5724
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Chemistry and Pharmacology
,
Geosciences
,
Physics
Notes:
The method proposed by Chang & Tang [Acta Cryst. (1988). A44, 1065-1072] of quantitative determination of X-ray reflection phases from multiple diffraction profiles is applied to nearly perfect crystals of gallium arsenide. The detailed intensity-profile-analysis procedures are given. Multiple diffraction profiles obtained with a conventional X-ray source and synchrotron radiation are subjected to this analysis. It is found that, for this particular diffraction example, errors as small as 15° in phase determination are achieved. Errors due to the theoretical approximation, peak position measurement and scaling factor are also discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0108767388008189
