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  • 1
    Electronic Resource
    Electronic Resource
    Performing current versus voltage measurements of single-walled carbon nanotubes using scanning force microscopy (2002)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 1462-1464 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In this letter, a method is presented to perform current versus voltage measurements on carbon nanotubes using the tip of a scanning force microscope as an electrode that can be positioned along the molecule. This method allows current versus voltage measurements to be carried out at any spot along a nanotube. By using this method, we present indications of ballistic transport in carbon nanotubes, as well as effects in the electrical properties due to the mechanical deformation. This is a general technique that can be applied to any conducting nanowire. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1453475
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