Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
80 (2002), S. 1462-1464
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
In this letter, a method is presented to perform current versus voltage measurements on carbon nanotubes using the tip of a scanning force microscope as an electrode that can be positioned along the molecule. This method allows current versus voltage measurements to be carried out at any spot along a nanotube. By using this method, we present indications of ballistic transport in carbon nanotubes, as well as effects in the electrical properties due to the mechanical deformation. This is a general technique that can be applied to any conducting nanowire. © 2002 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1453475
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