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Identification of two patterns in magnetic force microscopy of shape memory alloys (1999)

Neves, B. R. A. ; Andrade, M. S.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 74 (1999), S. 2090-2092

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: In this work, we report on the observation of two coexisting patterns in magnetic force microscopy (MFM) images of shape memory alloys. The MFM signal of both patterns presents similar behavior with tip–surface separation. An investigation on the origin of these patterns presents strong evidence that both are of magnetic nature only and, furthermore, can be assigned as bulk and surface-related, respectively. © 1999 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.123767

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