Digitale Medien
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
69 (1996), S. 1626-1628
ISSN:
1077-3118
Quelle:
AIP Digital Archive
Thema:
Physik
Notizen:
We have used a parallel-plate resonator technique to measure the microwave surface resist- ance Rs of YBa2Cu3O7−x (YBCO) films on buffered ceramic substrates at around 10 GHz, and studied the correlation between their Rs and materials properties. A 0.4-μm-thick YBCO film (with an in-plane mosaic spread of 7°) grown on a polycrystalline alumina substrate with an ion-beam-assisted-deposited yttria-stabilized zirconia buffer layer showed an Rs of 1.89 mΩ at 76 K and 0.21 mΩ at 4 K. We have observed a strong correlation between the Rs of the samples and the in-plane mosaic spread of the YBCO films. This correlation can be explained qualitatively in terms of a simple model in which the weak links between the grains of the YBCO film form an electrical network of Josephson junctions.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1063/1.117052
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