ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We have used a parallel-plate resonator technique to measure the microwave surface resist- ance Rs of YBa2Cu3O7−x (YBCO) films on buffered ceramic substrates at around 10 GHz, and studied the correlation between their Rs and materials properties. A 0.4-μm-thick YBCO film (with an in-plane mosaic spread of 7°) grown on a polycrystalline alumina substrate with an ion-beam-assisted-deposited yttria-stabilized zirconia buffer layer showed an Rs of 1.89 mΩ at 76 K and 0.21 mΩ at 4 K. We have observed a strong correlation between the Rs of the samples and the in-plane mosaic spread of the YBCO films. This correlation can be explained qualitatively in terms of a simple model in which the weak links between the grains of the YBCO film form an electrical network of Josephson junctions.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.117052