ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Critical-current densities have been measured in YBa2Cu3O7−x films deposited on (100) yttria stabilized zirconia (YSZ) and polycrystalline YSZ substrates as a function of temperature (4.5–88 K), magnetic field (0–1 T) and orientation relative to the applied field. The results indicate that in films on polycrystalline substrates, surface and interface pinning play a dominant role at high temperatures. In films on (100) YSZ, pinning is mainly due to intrinsic layer pinning as well as extrinsic pinning associated with the interaction of the fluxoids with point defects and low energy planar (2D) boundaries. The differences are attributed to the intrinsic rigidity of single fluxoids which is reduced in films on polycrystalline substrates thereby weakening the intrinsic layer pinning.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.107148