Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
58 (1991), S. 211-212
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Experimental verification is made of a new polarization splitter which utilizes artificial anisotropic dielectrics. The splitter is composed of layers of periodically laminated SiO2/TiO2 thin films. The SiO2 and TiO2 films are alternately deposited by rf sputtering and reactive dc sputtering, respectively. The thickness of each layer is 50 nm, while the total number of the layers amounts to 2000. The measured polarization split angles are 5.7° (λ=0.63 μm) and 5.1° (λ=1.3 μm), being roughly the same as those predicted.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.104691
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