Digitale Medien
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
86 (1999), S. 5841-5849
ISSN:
1089-7550
Quelle:
AIP Digital Archive
Thema:
Physik
Notizen:
A microscopic theoretical model is proposed for calculating the characteristics of ultraviolet photoemission and x-ray secondary electron emission induced from CsI photoconverters. This approach is based on a realistic picture of the basic interactions of photons and induced electrons within the material. Both differential and integral emission characteristics, such as energy spectra and quantum efficiencies, are estimated according to the model and are found to agree, in general, with experimental data. The model-calculated photoemission enhancement under high external electric fields is also considered and is fairly compatible with measured values. The applicability of the model in the field of radiation detectors incorporating solid photoconverters is discussed. © 1999 American Institute of Physics.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1063/1.371601
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