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Atomic level stress and light emission of Ce activated SrS thin films (1997)

Warren, W. L. ; Vanheusden, K. ; Tallant, D. R. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 82 (1997), S. 1812-1814

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: We find that the Ce3+ ion in polycrystalline sputtered SrS:Ce thin films resides in a distorted octahedral environment, as opposed to the cubic host environment. Using electron paramagnetic resonance and x-ray diffraction analysis, we show that the degree of axial distortion is related to the preferential growth direction of the SrS films. To first order, the blue-emission properties (emission wavelength and decay times) of the SrS:Ce films do not appear to be affected by the amount of distortion in the localCe3+ environment. © 1997 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.366284

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