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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 2228-2233 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin Fe2O3 layers (44 and 55 nm) were deposited by pulsed excimer laser ablation on single-crystal alumina (α-Al2O3) substrates heated at 675 °C. The ion beam mixing of these α-Fe2O3/α-Al2O3 couples was carried out using 300 keV Kr3+ ions at a fluence of 2×1016 ions/cm2. The mixing effect was followed by Rutherford backscattering spectrometry (RBS), conversion electron Mössbauer spectroscopy, and grazing incidence x-ray diffraction method. RBS spectra do not show any evidence of mixing at the interface, whereas the data obtained with the two other techniques display phases like oxygen deficient Fe3O4, Fe3−yAlyO4, and Fe1+xAl2−xO4. For this last phase, x is determined as being equal to about 0.5. It is shown that ion beam mixing is more efficient for the thinner Fe2O3 layer, in accordance with the projected range of the Kr3+ ions. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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