ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Al+ ions have been implanted in silica glass at an acceleration energy of 200 eV and doses ranging from 1×1013 to 1×1017 ions cm−2. Infrared reflection spectra and ultraviolet, visible, and near-infrared absorption spectra have been measured. It was found that refractive index of silica glass increased by 6%–10% after implantation of 1×1017 Al+ ions cm−2. It was deduced that this refractive index change is caused by the formation of Si—Si homobonds, but not by the decrease in Si—O—-Si bond angle which leads to compaction. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.360894