ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Biaxially aligned YBa2Cu3O7−x (YBCO) thin films were produced on polycrystalline Ni-based alloy, by using biaxial yttria-stabilized-zirconia (YSZ) intermediate layers formed by off-normal ion-beam-assisted deposition. Most explicit in-plane alignment was obtained when the YSZ layer formed with the beam-incident angle of 55° from substrate normal. Jc-B characteristics and angular dependence of Jc on the magnetic field were measured. 5.0×105 and 5.5×104 A/cm2 were obtained at 77 K with 0 and 8 T, respectively. The distribution of misorientation angles of in-plane a and b axes between YBCO grains was evaluated by both x-ray pole figure measurement and planar observations of transmission electron microscopy. 50% of the grains had the misorientation angles restricted within ±5°. From the image of dislocations, the elastic strains at grain boundaries were estimated to be relaxed with lower misorientation angle. The high-Jc properties are understood to be obtained by the current paths through low-angle grain boundaries.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.354801
