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Aging of superconducting Y1Ba2Cu3O7−x structures on silicon (1993)

Copetti, C. A. ; Schubert, J. ; Zander, W. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 73 (1993), S. 1339-1342

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: The long-term stability of epitaxial thin film structures of superconducting Y1Ba2Cu3O7−x on silicon wafers (100), using a yttria-stabilized ZrO2(YSZ) buffer, is presented and compared to identical structures on SrTiO3 (100) and yttria-stabilized ZrO2 (100) single crystals. For Y1Ba2Cu3O7−y/YSZ/Si heterostructures, the maximum Y1Ba2Cu3O7−y film thickness is limited to 50 nm; otherwise thermal strain induces microcracks. Thinner films are more stable, but nevertheless show aging over several weeks, which affects critical current density and room-temperature resistivity, but not the critical temperature Tc.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.353252

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