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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 65 (1989), S. 180-185 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Analysis has been made of the time dependence of surface recombination and release of deuterium from helium-bubble traps in iron with both clean and oxidized surfaces. In both cases second-order kinetics are obeyed over a large range of time scales, including short times when the traps are saturated. We show this is possible only if, in both cases, release is limited by escape from surface sites which have the same energy as the traps. We therefore propose that the oxide represents an additional barrier, but does not alter the energies of sites from which recombination takes place relative to solution sites. We further show that for both iron and stainless steel the prefactor for the recombination rate is about the same for a bare surface and for an oxide layer. Thus effects of the barrier are mostly on the activation enthalpy of release.
    Type of Medium: Electronic Resource
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