Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
64 (1988), S. 3727-3730
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Using the classical oscillator model, the optical dielectric functions for amorphous alumina (a-Al2O3) and gamma alumina (γ-Al2O3) thin films prepared by ion implantation and subsequent annealing of sapphire (α-Al2O3) substrates were determined for the first time from analysis of infrared reflection spectra. Two transverse optical modes at 422 and 721 cm−1 were obtained for the a-Al2O3 film while four modes at 357, 536, 744, and 807 cm−1 were identified for the γ-Al2O3 film. Also, the problems involving the analysis of modes with large damping are discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.341367
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