ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Spectroscopic instrumentation is one of the keys to the exploration of high-temperature plasmas. The electron beam ion trap (EBIT) can serve as a tool for precise studies of highly charged ions in the laboratory and can help in setting spectroscopic standards for plasma studies. Recent efforts have focused on investigating the EUV, vacuum ultraviolet (VUV), and UV regimes. We present here the implementation of a 1 m normal incidence spectrometer for use on the Lawrence Livermore National Laboratory high-energy EBIT (Super-EBIT) for spectral analysis of line emission of highly charged ions. Using two different gratings, our study encompasses a wide range of wavelengths spanning the VUV through the visible. Examples of measurements of optical spectra from krypton and argon are given. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1149325
