ZIB

Hits per page

hit 1 - 1 | 1 hit

Select All Export

Electronic Resource

Beam diagnostics (invited) : Proceedings of the fourth International Conference on Ion Sources (1992)

Strehl, P.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 63 (1992), S. 2652-2659

add to mindlist on the mindlist

Details

ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: Although the types of ion sources in many applications are of great diversity the quality of a source can be assessed mostly by the measurement of the same beam parameters. In this paper the characteristics of various devices for measurement of beam currents, beam profiles, and transverse emittances are discussed. Special reference is given to the limitations arising from thermal heating in case of very intense beams. On the other hand, the detection limits given by electrical noise in case of very low currents are considered.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1142869

Library	Location	Call Number	Volume/Issue/Year	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

hit 1 - 1 | 1 hit