ISSN:
1013-9826
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
X-ray diffraction (XRD) method to measure the residual stress existing in the metal substratesurface layer was introduced and the sol-gel ZrO2-CeO2 thin film was successfully prepared on SUS304stainless steel substrate by dip-coating process. The macro residual stress existing in metal substrate wasanalyzed by XRD. It turns out that the compressive stress existing in the metal substrate surface layerincreases with the increase of heat-treated temperature. Based on the above study, colored stainless steelsof high quality were prepared by sol-gel process
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/01/54/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.336-338.2649.pdf