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  • Articles: DFG German National Licenses  (90)
  • 2000-2004  (11)
  • 1995-1999  (58)
  • 1940-1944  (12)
  • 1850-1859  (9)
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  • Articles: DFG German National Licenses  (90)
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  • 11
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 66 (1995), S. 1432-1434 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Shear force microscopy is very useful for distance regulation in near-field scanning optical microscopy (NSOM). However, the optical method used to detect the shear force can cause problems when imaging photosensitive materials, i.e., the shear force detection beam can optically pump the sample. We present here a new approach to shear force detection based upon capacitance sensing. The design, operation, and performance of the capacitance detection are presented. Shear force topographic images of hard and soft surfaces are shown using tungsten and NSOM fiber tips. The closed loop vertical sensitivity achieved is 0.01 nm/(square root of)Hz. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 12
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 66 (1995), S. 2309-2311 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A submicrometer photodiode probe with a sub-50 nanometer tip radius has been developed for optical surface characterization on a nanometer scale. The nanoprobe is built to detect subwavelength optical intensity variations in the near field of an illuminated surface. The probe consists of an Al–Si Schottky diode constructed near the end of a micromachined pyramidal silicon tip. The process for batch fabrication of the nanoprobes is described. Electrical and optical characterization measurements of the nanoprobe are presented. The diode has a submicrometer optically sensitive area with a 150 fW sensitivity. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 13
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 66 (1995), S. 1264-1266 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The atomic ordering of GaInP has been established and studied by a variety of methods, including transmission electron microscopy, cathodoluminescence, and photoluminescence. In this work, a Kelvin probe force microscope (KPFM) has been employed to image several GaInP samples previously characterized by these established techniques. The results of our study clearly show that the KPFM is capable of distinguishing between ordered and disordered regions in GaInP, and that the KPFM contrast strongly depends on the amplitude of the applied ac bias voltage of the KPFM. The measurements indicate that ordering in GaInP modifies the density and/or lifetime of the surface states. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 14
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 3644-3646 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Pulsed (λ=248 nm, pulse width=20 ns) KrF-excimer-laser-induced etching of La0.75Ca0.25MnOx (LCMO) thin films exhibiting giant magnetoresistance (GMR) has been studied. The variation of etch depth as a function of the number of laser pulses shows a linear dependence in the fluence range between 0.15 and 4 J cm−2. The threshold fluence for ablation is found to be 0.07 J cm−2. The photoetching process is seen to follow the Beer–Lambert's relation based on a linear absorption model with an absorption length of 28.3 nm. The nanomorphology of the laser etched surface as revealed by atomic force microscopy shows significant improvement in the surface smoothness of the deposited films for etching at low energy densities (typically 0.17 J cm−2) and enhanced roughness at higher energy densities (typically 0.86 J cm−2). Changes in the resistivity and GMR effect due to laser treatment are also examined. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 15
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 66 (1995), S. 344-346 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Quantitative dopant profile measurements are performed on a nanometer scale by scanning capacitance microscopy (SCM). An atomic force microscope is used to position a nanometer scale tip at a semiconductor surface, and local capacitance change is measured as a function of sample bias. A new feedback method has been demonstrated in which the magnitude of the ac bias voltage applied to the sample is adjusted to maintain a constant capacitance change as the tip is scanned across the sample surface. A quasi-1D model is used to extract dopant density profiles from the SCM measurements. The inverted SCM dopant profiles are compared with profiles obtained by process simulation and secondary ion mass spectroscopy measurement. Good agreement was found between the SCM measured profile and the lateral profile predicted by SUPREM 4 over the concentration range from 1017 to 1020 cm−3. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 16
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 853-855 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report our femtosecond time-resolved measurements on the photoresponse of an epitaxial YBa2Cu3O7−x (YBCO) thin-film photodetector, patterned into a microbridge geometry. By varying the current–voltage biasing conditions between the superconducting and resistive (hot spot) states, we observed transients that correspond to the nonequilibrium kinetic-inductance and the nonequilibrium electron-heating response mechanisms, respectively. The two-temperature model and the Rothwarf–Taylor theory have been used to simulate the measured wave forms and to extract the temporal parameters. The electron thermalization time and the electron–phonon energy relaxation time were determined by the electron temperature rise and decay times, which were found to be 0.56 and 1.1 ps, respectively, in the resistive state. We have also measured the ratio between the phonon and electron specific heats to be 38, which corresponds to a phonon–electron scattering time of 42 ps. No phonon-trapping effect (typical for low-temperature superconductors) was observed in YBCO, in the superconducting state, so the quasiparticle lifetime was given by the quasiparticle recombination time, estimated from the Rothwarf–Taylor equations to be below 1 ps. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 17
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 1179-1181 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Near-field photodetection optical microscopy (NPOM) is a fundamentally new approach to near-field optical microscopy. This scanning probe technique uses a nanometer-scale photodiode detector which absorbs optical power directly as it is scanned in the near field of an illuminated sample surface. We have applied NPOM to measure the visible absorption spectrum of dye molecules embedded in a single 300 nm polystyrene sphere. The near-field absorption spectrum is obtained by measuring the NPOM probe photocurrent while the wavelength of the illumination pump beam is scanned from 450 to 800 nm. Peaks are identified at 567, 608, and 657 nm in the near-field spectrum of the single-dyed polystyrene sphere. These peak positions are in good agreement with far-field absorption measurements performed on many dyed polystyrene spheres. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 18
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 68 (1996), S. 2082-2084 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have applied extended x-ray absorption fine structure (EXAFS) spectroscopy to study the cation distribution in a series of spin-sprayed NiZn-ferrite films. A least-squares fitting of experimental EXAFS data with theoretical, multiple-scattering, EXAFS data allowed the quantitative determination of site distributions for all transition metal cations. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 19
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 3615-3617 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A method is introduced for measuring the tunneling of electrons between a specially fabricated scanning probe microscope tip and a surface. The technique is based upon electrostatic force detection of charge as it is transferred to and from a small (10−17 F) electrically isolated metallic dot on the scanning probe tip. The methods for dot fabrication, charging, and discharging are described and electron tunneling to a sample surface is demonstrated. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 20
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Child 22 (1996), S. 0 
    ISSN: 1365-2214
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Medicine , Psychology
    Notes: We assessed the outcome of the use of an enuretic alarm and desmopressin according to conventional guidelines and investigated the reasons for resistance to desmopressin. Children were given a 4 month course using an enuretic alarm if they had not previously used one; 12 out of 21 were dry (57%) after 4 months and one relapsed 1 month later. Those who had previously failed with an alarm or were considered poorly motivated to use it, were given a 4 month course of intranasal desmopressin. Of these 26 children, 10 (38%) were dry at the end of 4 months but only two (7%) remained dry after this was withdrawn. After the initial treatment with alarm or desmopressin, 27 children were still enuretic and attending the clinic. They were shown how to use the alarm and eight also used the dry bed training technique: 15 had become dry after a further 6 months. Of the 12 children who made no response to intranasal desmopressin, nine were given this medication under supervision in hospital; seven of these children still wet the bed despite producing small amounts of concentrated urine overnight. They also had small measured diurnal bladder capacities. We conclude that if a 4 month course with an enuretic alarm is unsuccessful, rather than using desmopressin, the alarm should be continued with relearning and consideration given to additional use of the dry bed training technique. The major factor causing nocturnal enuresis in children is likely to be a small nocturnal bladder capacity.
    Type of Medium: Electronic Resource
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