Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
81 (2002), S. 1279-1281
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Textured thin films of nominal composition Ni0.50(MnGa)0.50 were sputter deposited on Si substrates and studied by x-ray diffraction, micromechanical displacement, dc magnetization, and ferromagnetic resonance (FMR). We report the observation of spin wave resonances in this alloy, yielding a spin wave stiffness of D=200 meV Å2 at 300 K. A marked thermal hysteresis is observed in the temperature-dependent FMR data arising from the reversible martensitic transition. © 2002 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1501161
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