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  • Electronic Resource  (4)
  • 1985-1989  (3)
  • 1975-1979  (1)
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  • Electronic Resource  (4)
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  • 1
    Electronic Resource
    Electronic Resource
    Magnetic microstructure of amorphous alloys studied using scanning electron microscopy with polarization analysis (abstract) (1987)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 61 (1987), S. 3217-3217 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The recent development of scanning electron microscopy with polarization analysis (SEMPA) has made the direct measurement of magnetic structures with submicron spatial resolution possible.1,2 Because the secondary electron spin polarization is proportional to the magnetization in the area probed by the incident electron beam, the magnetization is measured directly, independent of topographic contrast. Topographic images are measured simultaneously, however, permitting comparisons between magnetic and structural properties. In addition the use of multiple, orthogonal detectors permits measurement of the magnetization magnitude and direction. We have recently used this technique to look at various Fe-rich amorphous ferromagnetic alloys. In particular SEMPA was used to examine the rotation of the magnetization within domain walls and to study changes in magnetic microstructure due to Ar ion bombardment and annealing.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.338906
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Improved instrument for medium energy electron diffraction and microscopy of surfaces (1985)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 1215-1219 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The REMEDIE system for reflection electron microscopy and electron diffraction at intermediate energies (0.5–20 keV) has been rebuilt with an improved imaging resolution of better than 10 nm, a convenient and versatile system for observation diffraction patterns and provision for specimen preparation and treatment suitable for surface structural studies. The current capabilities of the instrument are illustrated by results obtained from cleaved and annealed silicon (111) surfaces with or without thin deposited silver and gold layers.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1137978
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Scanning electron microscopy with spin polarized electrons (invited) (abstract) (1987)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 61 (1987), S. 4307-4307 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The recent joining of scanning electron microscopy and electron spin polarization analysis has greatly improved the ability to study magnetic microstructure.1,2 By measuring the spin polarization of secondary electrons, scanning electron microscopy with polarization analysis (SEMPA) can directly measure the magnitude and direction of the magnetization and direction of the magnetization in the region probed by the incident electron beam. This region is defined by the diameter of the incident electron beam (∼10 nm) and the escape depth of the secondaries (∼5 nm). In addition to the purely magnetic image SEMPA also simultaneously and independently measures the usual topographic image, thereby making comparisons between magnetic and topographic structures easier. We have successfully used SEMPA to study magnetic structures in Fe crystals, permalloy films, CoNi recording media, and metglasses. Examples from this work will be given in order to demonstrate the unique capabilities of SEMPA.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.338454
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    The oxidation of copper studied by electron scattering techniques (1979)
    Springer
    Oxidation of metals 13 (1979), S. 331-351 
    Details
    ISSN: 1573-4889
    Keywords: oxidation ; copper ; thin films ; electron microscopy ; electron diffraction
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The oxidation of thin single-crystal (100) and (111) films of copper at pressures of around 10−5 Torr and temperatures of 400 to 700°C has been observed by medium-energy electron diffraction, scanning electron microscopy, scanning and conventional microscopy using diffracted electron beams in the reflection mode, transmission electron microscopy, and transmission electron diffraction. Epitaxed nuclei of oxide are observed to grow into very thin single-crystal plates, using oxygen previously trapped in the copper film. There is considerable diffusion of the copper film. There is considerable diffusion of the copper away from the oxide. Between the oxide crystallites the copper surfaces appear to be unoxidized. A mottled contrast of the diffracted beam images of the copper surface is shown to result from many-beam dynamical diffraction effects.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00609304
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    Paper (German National Licenses)
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