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  • 1
    Electronic Resource
    Electronic Resource
    Some results concerning the potential energy of interfaces with nonuniformly distributed surfactant (2001)
    [S.l.] : American Institute of Physics (AIP)
    Physics of Fluids 13 (2001), S. 3089-3092 
    Details
    ISSN: 1089-7666
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A functional is presented for the stored energy content, or potential energy, of a nonuniform distribution of surfactant on a liquid interface. This is the energy available to drive fluid motion using surface-tension-gradient forces. The functional is shown to be non-negative. An energy evolution equation is derived for the motion of a thin liquid film, whose shape evolves under the combined influence of surface tension, viscous, and surfactant effects. Numerical calculations show the time history of these global energy components. Results are relevant to the flow behavior of wetting agents, soap films, foams, and emulsions with possible applications in the industrial and biological worlds. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1398535
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  • 2
    Electronic Resource
    Electronic Resource
    Fingering phenomena for driven coating films (2000)
    [S.l.] : American Institute of Physics (AIP)
    Physics of Fluids 12 (2000), S. 1278-1295 
    Details
    ISSN: 1089-7666
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A theoretical and numerical model is formulated to describe the instability and the long-time evolution of both gravity-driven and surface-shear-stress-driven thin coating films. A single evolution equation, of higher-order diffusive type, models the flow for either problem. It is derived using the lubrication approximation. For partially wetting systems, the effect of finite contact angle is incorporated in the equation using a particular disjoining pressure model. The base state, in each case, is a two-dimensional steadily propagating capillary front. Slight perturbations of the base state, applied along the front, initiate the fingering instability. Early-time results accurately reproduce the wavelengths of fastest growth and the corresponding eigenmodes as reported in published linear stability analyses. As time proceeds, depending on parameter values, various fingering patterns arise. For conditions of perfect wetting with the substrate downstream of the moving front covered with a thin precursor layer, predicted nonlinear finger evolution agrees well with published experiments. The ultimate pattern, in this case, is a steadily translating pattern of wedge-shaped fingers. Alternatively, for partially wetting systems that exhibit sufficiently large static contact angles, long straight-sided fingers or rivulets are formed. Finally, for larger contact angles, or at relatively low speeds, we predict that the flowing rivulets will become unstable and break up into strings of isolated droplets. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.870382
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  • 3
    Electronic Resource
    Electronic Resource
    Investigation of titanium silicide formation in Ti+Si reactions using infrared spectroscopy and x-ray diffraction (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 5156-5159 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Infrared (IR)-absorbance spectroscopy was investigated as a technique for monitoring titanium silicide formation during the reaction of Ti films on (100) Si substrates. Films annealed to various stages of reaction were monitored by x-ray diffraction, film resistivity, and optical reflectance in order to relate the changes in the IR-absorbance spectra to reaction progress. Films at different stages of reaction showed distinctly different extinction coefficients α, and absorbance versus wave-number curves. IR absorbance was determined to be a useful indicator of reaction progress, especially in those cases where samples at different stages of the silicidation reaction have the same resistance but different absorbance behaviors. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.359260
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  • 4
    Electronic Resource
    Electronic Resource
    A kinetic study of the C49 to C54 TiSi2 conversion using electrical resistivity measurements on single narrow lines (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 7040-7044 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We describe a simple quasi-in situ resistivity technique and its application to the study of C49 to C54 TiSi2 conversion in narrow (0.1-1.0 μm) lines. This technique allowed comparison of both aggregate conversion versus time at temperature behavior and individual-line conversion versus time behavior for silicide lines of different linewidths. As linewidth decreased, the aggregate conversion versus time at temperature behavior slowed, and the conversion behaviors of individual lines having the same linewidth became more variable. Both of these observations are consistent with a nucleation-site-density controlled reaction under conditions of low nucleation site density. Correlations were also found between individual line behaviors and resistance to agglomeration; resistance to agglomeration (for 0.35–1.0 μm lines already in the C54 phase) was highest for lines which had "prompt'' conversion behaviors (as measured by the sheet resistance drop during the first minute of the conversion anneal). Additional data concerning the sensitivity of the initial sheet resistances to formation anneal conditions and linewidth is also briefly discussed. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.360407
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  • 5
    Electronic Resource
    Electronic Resource
    Issues in the Design of a Multirate Model-Based Controller for a Nonlinear Drug Infusion System (1995)
    s.l. : American Chemical Society
    Biotechnology progress 11 (1995), S. 318-332 
    Details
    ISSN: 1520-6033
    Source: ACS Legacy Archives
    Topics: Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/bp00033a013
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  • 6
    Electronic Resource
    Electronic Resource
    An improved fast-response microthermocouplea) (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 4731-4733 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An improved wire-type chromel–alumel microthermocouple with a disk-shaped junction is described. In this design, the 20 μm diameter thermocouple wires are installed taut between two 127 μm diameter prongs, one of chromel and the other of alumel. The disk junction, of 0.1 mm diameter and 4 μm thick, is located approximately midway between the prong tips. Time constants of two microthermocouples are reported. The two microthermocouples differ from each other primarily in the length of the prongs. The microthermocouple with the longer prongs exhibits faster response, its time constant in turbulent flow of liquid Refrigerant-113 (a poor conductor of heat) being less than 2 ms. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145315
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  • 7
    Electronic Resource
    Electronic Resource
    In situ x-ray diffraction analysis of the C49–C54 titanium silicide phase transformation in narrow lines (1995)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 66 (1995), S. 1732-1734 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The transformation of titanium silicide from the C49 to the C54 structure was studied using x-ray diffraction of samples containing arrays of narrow lines of preformed C49 TiSi2. Using a synchrotron x-ray source, diffraction patterns were collected at 1.5–2 °C intervals during sample heating at rates of 3 or 20 °C/s to temperatures of 1000–1100 °C. The results show a monotonic increase in the C54 transition temperature by as much as 180 °C with a decreasing linewidth from 1.0 to 0.1 μm. Also observed is a monotonic increase in (040) preferred orientation of the C54 phase with decreasing linewidth. The results demonstrate the power of in situ x-ray diffraction of narrow line arrays as a tool to study finite size effects in thin-film reactions. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.113349
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  • 8
    Electronic Resource
    Electronic Resource
    Low temperature formation of C54–TiSi2 using titanium alloys (1997)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 71 (1997), S. 3531-3533 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We demonstrate that the temperature at which the C49 TiSi2 phase transforms to the C54 TiSi2 phase can be lowered more than 100 °C by alloying Ti with small amounts of Mo, Ta, or Nb. Titanium alloy blanket films, containing from 1 to 20 at. % Mo, Ta, or Nb were deposited onto undoped polycrystalline Si substrates. The temperature at which the C49–C54 transformation occurs during annealing at constant ramp rate was determined by in situ sheet resistance and x-ray diffraction measurements. Tantalum and niobium additions reduce the transformation temperature without causing a large increase in resistivity of the resulting C54 TiSi2 phase, while Mo additions lead to a large increase in resistivity. Titanium tantalum alloys were also used to form C54 TiSi2 on isolated regions of arsenic doped Si(100) and polycrystalline Si having linewidths ranging from 0.13 to 0.56 μm. The C54 phase transformation temperature was lowered by over 100 °C for both the blanket and fine line samples. As the concentration of Mo, Ta, or Nb in the Ti alloys increase, or as the linewidth decreases, an additional diffraction peak appears in in situ x-ray diffraction which is consistent with increasing amounts of the higher resistivity C40 silicide phase. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.120401
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  • 9
    Electronic Resource
    Electronic Resource
    A COMPARISON OF RADIOGRAPHY, COMPUTED TOMOGRAPHY, AND MAGNETIC RESONANCE IMAGING FOR THE DIAGNOSIS OF PALMAR PROCESS FRACTURES IN FOALS (1995)
    Oxford, UK : Blackwell Publishing Ltd
    Veterinary radiology & ultrasound 36 (1995), S. 0 
    Details
    ISSN: 1740-8261
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Medicine
    Notes: The relative sensitivity of radiography, computed tomography, and magnetic resonance imaging for detecting palmar process fractures of the distal phalanx in foals was determined and the imaging findings were compared with histomorphologic evaluations of the palmar processes. Compared to radiography, computed tomography and magnetic resonance imaging did not improve the sensitivity for detection of palmar process fractures. Statistical agreement for palmar process fracture diagnosis was excellent among the three imaging modalities. Histomorphologic evaluations were more sensitive for diagnosis of palmar process fracture than any of the imaging modalities. Three-dimensional image reconstructions and volume measurements of distal phalanges and palmar process fracture fragments from computed tomography studies provided more complete anatomical information than radiography. Magnetic resonance imaging confirmed that the deep digital flexor tendon insertion on the distal phalanx is immediately axial to the site where palmar process fractures occur, and differentiated cartilage, bone, and soft tissue structures of the hoof.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1740-8261.1995.tb00298.x
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  • 10
    Electronic Resource
    Electronic Resource
    CREATING MEANINGFUL STAKEHOLDER INVOLVEMENT IN WATERSHED PLANNING IN PIERCE COUNTY, WASHINGTON (2002)
    Oxford, UK : Blackwell Publishing Ltd
    Journal of the American Water Resources Association 38 (2002), S. 0 
    Details
    ISSN: 1752-1688
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Architecture, Civil Engineering, Surveying , Geography
    Notes: : Since 1989, the government of Pierce County, Washington, has prepared four watershed action plans. The watersheds cover almost 800,000 acres and include about 600,000 residents and diverse land uses, from the city of Tacoma to Mount Rainier National Park. The primary purpose of these plans was to address water quality impacts from nonpoint sources of pollution and to protect beneficial uses of water. Pierce County has experienced problems such as shellfish bed closures and the Federal Clean Water Act Section 303(d) listing of local water bodies as a result of declining water quality. Pierce County achieved improvements by engaging diverse groups of stakeholders in generating solutions to nonpoint sources of water pollution through our watershed planning process. Using participatory methods borrowed from private industry, Pierce County was able to reach consensus, build trust, maximize participation, facilitate learning, encourage creativity, develop partnerships, shorten time frames for the planning processes, and increase the level of commitment participants had to implementing the plans. As a result, the earliest plans have a high rate of voluntary implementation. This indicates that the process and methodology used to develop watershed plans has a significant, if not critical, impact on their success.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1752-1688.2002.tb05539.x
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