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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 3299-3302 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Fe–N films were prepared by ion-beam-assisted deposition at different N/Fe atomic arrival ratios to the substrates. Films consisted of nitrogen-rich α-Fe and different phases of iron nitrides including ζ-Fe2N, ε-Fe2-3N, and γ′-Fe4N were formed. The phase composition of Fe–N films was found to depend sensitively on the N/Fe atomic arrival ratio and deposition temperature. The magnetic properties of the films mainly depends on phase composition. It was found that nitrogen-rich α-Fe films exhibited higher Ms than that of the pure iron film, and their Ms could be increased further by vacuum annealing at relatively low temperatures. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 3847-3854 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High-current Fe ion implantation technique was employed to synthesize Fe-silicide layers on Si wafers, using a newly constructed metal vapor vacuum arc ion source. The Fe ions were extracted at a voltage of 40 kV with a varying ion current density from 65 to 152 μA/cm2 and a nominal ion dose varied from 3×1017 to 3×1018 Fe/cm2. At a fixed nominal dose of 4×1017 Fe/cm2, a semiconducting β-FeSi2 layer gradually grew on Si with increasing ion current density and a qualified β-FeSi2 layer with a relative sharp interface was obtained, when the ion current densities exceeded 115 μA/cm2. While implanting at a fixed ion current density of 152 μA/cm2 with varying ion dose, the β-FeSi2 phase began to form first at a nominal dose of 3×1017 Fe/cm2, and eventually transformed into a metallic α-FeSi2 phase when the nominal dose reached 3×1018 Fe/cm2. Further information of the formation of Fe disilicides was obtained by comparing the postannealing results of some of the implanted wafers with those observed immediately after implantation. The formation mechanism of the Fe disilicides is discussed in terms of the beam heating effect, which in turn resulted in a simultaneous thermal annealing during Fe ion implantation.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 4040-4048 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A global plasma model for an ionized physical vapor deposition (IPVD) system is described. The model predicts the density of electrons, excited state, Ar and N2, ironized Ar, N2, and Ti, the density of atomic N and N+, and the electron temperature. The computed results are compared to experimental measurements of a titanium nitride IPVD reactor to confirm the validity of the model. The reactor consists of an inductively coupled plasma source that is fed by argon, nitrogen, and sputtered titanium. The dissociation of nitrogen in the discharge is typically found to be in the range of 10%–30%. The electron temperature is 1.8 eV, and the ion density is between 2×1011 and 6×1011 cm−3. The ion density is found to decrease as nitrogen is added to the Ar discharge due to collisional losses associated with molecular states. In the metal mode of operation, the atomic nitrogen density is suppressed by the Ti-rich reactor walls. As the nitrogen flow rate is increased, the target and walls become nitrided and the density of N increases an order of magnitude to 2–4×1012 cm−3. The ionization fraction for the depositing flux of titanium is typically 0.4–0.7. The model is easily adapted to other technologically relevant diffusion barrier layer materials such as WN and TaN. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 2354-2358 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The moving species during ion beam mixing of Si/Ni and Si/Pt bilayers were investigated at temperatures between liquid-nitrogen temperature (LN2) and 180 °C using imbedded markers and Rutherford backscattering. For Si/Ni samples irradiated with Ar ions, the flux ratio of Si to Ni decreased from 1.6 to 0.2 as the substrate temperature increased from LN2 to 180 °C. Over this range of substrate temperatures, the individual amount of Si atoms transported was found to remain unchanged; whereas the transport flux of Ni atoms was observed to increase. Similar temperature dependence of the flux ratio was found for the Si/Pt system. The experimental results indicate that the substantial Si motion is due to the temperature-independent part of ion mixing which is associated with collision cascades. The Ni motion is characteristic of radiation-enhanced diffusion which is substrate temperature dependent.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 1929-1932 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Fe/Au multilayers were prepared by alternative vapor deposition. The periodicity, thickness, chemical composition, microstructure, and the magnetic moment of the films were determined and measured by various methods. The magnetic moment per Fe atom in Fe/Au multilayers was considerably enhanced when the Fe layer thickness was thinner than 8 nm and it was up to 2.59 μB, i.e., about 1.2 times of that of bulk Fe, at an Fe layer thickness of 4.5 nm. The experimental results also revealed that as the thickness of the Fe layer decreased, there was an increasing tendency towards perpendicular magnetization in the Fe/Au multilayers. The possible mechanism responsible for the modification of magnetic properties is also discussed.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 1702-1710 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The amorphization of Ni-Nb multilayered alloy films by xenon ion irradiation at room temperature and by high-temperature solid-state reaction was studied. The composition range favoring amorphization was carefully determined to be 20–85 at. % Ni by energy-dispersive spectroscopy attached to the transmission electron microscope. A new metastable crystalline phase (MX) of hexagonal structure was formed in Ni75Nb25 and Ni70Nb30 multilayered films. Interestingly, in the Ni75Nb25 multilayered films, with increasing mixing dose an amorphous phase was first formed and then the MX-phase was observed, while in the Ni70Nb30 multilayered films the MX phase was formed at relatively low doses and turned amorphous upon further mixing or 400 °C annealing for 2 h. Besides, annealing of the as-deposited Ni70Nb30 multilayered films at 300 °C for half an hour also resulted in the formation of the MX phase. The thermal stability of the ion-mixed amorphous alloys was also studied by subsequent annealing. To give semiquantitative interpretation to all the above observations, the Gibbs free-energy diagram of the system, in which especially the free-energy curve of the MX phase is added, was constructed on the basis of the model of Nissen et al. [CALPHAD 7, 51 (1981)] and the method proposed by Alonso and Simozar [Solid State Commun. 46, 765 (1983)]. The explanation based on this diagram is in good agreement with our experimental results.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 58 (1987), S. 212-214 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The accuracy of lattice parameter determinations by Read camera x-ray diffraction is shown to be strongly dependent on camera alignment. Alignment of the Read camera eliminates the main sources of error. Further improvement in analysis was achieved by constructing a collimator with a rectangular cross section. Analysis and testing showed that the rectangular collimator enhances the efficiency, resolution, precision, and peak-to-background intensity ratio for x-ray analysis of thin films using the Read camera.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 62 (1993), S. 2356-2358 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report, in this letter, the formation of TiSi2 by direct Ti-ion implantation into silicon wafers using a metal vapor vacuum arc ion source. Implantation was conducted by 80 KeV Ti ions to a dose of 5×1017/cm2 with various ion current densities. When the ion current density exceeded 100 μA/cm2, the equilibrium TiSi2 of the C54 structure was uniquely formed. Additional evidence of the formation of C54-TiSi2 was given by the resistivity measurements, i.e., the sheet resistivity was below 3.0 Ω/(D'Alembertian). The formation mechanism is also discussed in terms of the beam heating effect during implantation.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 60 (1992), S. 944-946 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Al80Yb20 multilayered alloy films were amorphized by ion beam mixing at room temperature. A new metastable phase of hexagonal structure was formed when the irradiation dose was greater than that required to amorphize the alloy films. The metastable phase turned amorphous when the film was annealed at 500 °C for 10 min. It was also found that Al-Yb multilayers could be amorphized by solid state reaction. Al1−xYbx multilayered alloy films, with 17〈x〈30 at. %, became amorphous through interdiffusion at 450 °C for 20 min.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Nuclear Inst. and Methods in Physics Research, B 19-20 (1987), S. 753-757 
    ISSN: 0168-583X
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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