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  • 1985-1989  (2)
  • 1935-1939
  • 68.35  (1)
  • Acute disseminated encephalomyelitis  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Cranial computed tomography in acute disseminated encephalomyelitis (1989)
    Springer
    Neuroradiology 31 (1989), S. 8-12 
    Details
    ISSN: 1432-1920
    Keywords: Acute disseminated encephalomyelitis ; cranial computed tomography
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Summary Acute disseminated encephalomyelitis (ADEM) is an uncommon inflammatory disorder of the nervous system. The appearance of ADEM on cranial CT scans has rarely been reported. The author reports seven cases in two instititions during a period of seven years. Only four of the seven patients had hypodense lesions in the white matter and six patients showed spotty, nodular, or gyral enhancement after contrast injections. The enhancement resolved with steroid therapy, leaving some persistent hypoattenuated areas even after 10 months follow-up, these findings support the dual components of the pathogenesis of ADEM. The vasculitic component may be responsive to steroids, nevertheless the demyelinating or necrotic areas may not, and the latter may be responsible for the sequelae of ADEM.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00342021
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Transmission electron microscopy study of defects in Sn-doped GaAs films grown by molecular beam epitaxy (1987)
    Springer
    Applied physics 44 (1987), S. 143-151 
    Details
    ISSN: 1432-0630
    Keywords: 68.55Jh ; 81.30Fb ; 68.35
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Films of GaAs, heavily doped with Sn, which have been grown by molecular-beam epitaxy are found to contain single-crystal Sn particles situated in the nearsurface region of the epilayer GaAs. The morphology and chemical composition of the particles have been examined by using cross-section transmission electron microscopy combined with energy-dispersive x-ray spectroscopy. Different growth conditions were used to study the Sn-particle formation and high-resolution transmission electron microscopy was used to investigate microstructures. The observations are discussed in terms of several models previously proposed for these phenomena.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00626415
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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