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  • 11
    Electronic Resource
    Electronic Resource
    Evidence for 2D XY Kosterlitz-Thouless transitions in magnetic graphite intercalation compounds (1987)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 61 (1987), S. 4398-4400 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic graphite intercalation compounds (GIC's) allow a controlled separation of atomically abrupt magnetic layers by variation of the stage of the sample. Thus very small J'/J values (∼10−4) and quasi-two-dimensional behavior can be achieved where J' and J are, respectively, the interplanar and intraplanar exchange constants. The applicability of a 2D XY model is established by a comparison of the high-temperature susceptibility with the high-temperature series expansions for the various 2D and 3D models. Low-temperature studies provide values for magnetic interactions pertinent to the most interesting intermediate temperature range, where a 2D XY bound vortex phase may occur.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.338437
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  • 12
    Electronic Resource
    Electronic Resource
    Effects of krypton on CrSi2 formation (1986)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 59 (1986), S. 1998-2001 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The influence and redistribution of the inert gas Kr in chromium silicide formation have been investigated by MeV He backscattering spectrometry and transmission electron microscopy. It was found that krypton implanted in the chromium film remains stationary with respect to the chromium during silicide formation, but krypton implanted in the silicon substrate accumulate at the silicon/silicide interface. The effect of krypton on the rate of silicide formation is much more pronounced when the krypton is in the chromium rather than in the silicon substrate. The thermal growth of CrSi2 is linear with time in a krypton-free sample, but becomes parabolic when the krypton is incorporated in the silicide at a concentration of 1 at. %. The activation energy associated with Si diffusion through CrSi2 is increased from 1.4±0.1 eV to 2.6±0.1 eV by the presence of krypton in the silicide. The results are interpreted as being due to segregation of krypton on grain boundaries in CrSi2 and subsequent retardation of diffusion along the boundaries.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.336379
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  • 13
    Electronic Resource
    Electronic Resource
    Adhesion and deformation of metal/polyimide layered structures (1989)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 65 (1989), S. 1911-1917 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Adhesion and interfacial failure of Cr, Cu, and Cu/Cr films on a thin pyromellitic dianhydride-oxydianiline polyimide substrate have been investigated using a recently developed stretch deformation technique. This method directly measures the energy required to separate the interface from the difference in the load versus elongation curves between film/substrate and substrate structures. The failure mode was observed in combination with morphological studies by in situ optical microscopy and scanning and transmission electron microscopies. The stress distribution in the sample upon stretching has been computed by a finite element analysis. The difference in the stress relief modes, film fracture, and delamination behavior for Cu versus Cr films is discussed. The important role of crack formation in the metal overlayer for initiating failure is demonstrated. The effects due to the addition of a brittle Cr interface layer between polyimide and Cu on the buildup of stress and the onset of failure have also been investigated.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.342903
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  • 14
    Electronic Resource
    Electronic Resource
    The structure of Ni5Si2 formed in Ni-Si thin-film lateral diffusion couples (1987)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 62 (1987), S. 1189-1194 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The microstructure of the nickel silicide, Ni5Si2, which forms during solid-state reactions using self-supporting Ni-Si lateral-diffusion couples, has been studied using high-resolution electron microscopy (HREM) and selected-area electron diffraction. Two different structures for Ni5Si2 have been identified, one of which is consistent with the crystal structure which has been reported to have an actual composition of Ni31Si12. There is evidence for the existence of a third structure. Variations in the distribution of these structures and the presence of planar defects may account for the reported composition range of Ni5Si2 in the Ni-Si phase diagram. The observed HREM images are compared with computer simulated images.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.339830
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  • 15
    Electronic Resource
    Electronic Resource
    Stress relaxation during thermal cycling in metal/polyimide layered films (1988)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 6690-6698 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The stress relaxation behavior during thermal cycling of metal/quartz and metal/polyimide/quartz layered structures has been investigated using a cantilever bending beam technique. The metals chosen for this study include Cu and Cr, two materials with contrasting mechanical and interfacial bonding properties. A finite element analysis, as well as an analytical calculation, has been carried out to deduce the stress distribution in the layered structures. Results indicate that the extent of stress relaxation strongly depends on the intrinsic mechanical property of the metal film with significantly higher stresses residing in the Cr film than in the Cu film. The interfacial polyimide layer has been found to serve as an effective buffering layer to reduce the residual stress in metal films. Observations from transmission electron microscopy suggest that the stress is partially released through the deformation of the polyimide near the metal/polyimide interface.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.341999
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  • 16
    Electronic Resource
    Electronic Resource
    Magnetic properties and microstructure of magnesium-doped Nd-Fe-B magnets (1988)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 5513-5515 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A number of Nd15 Fe79−x Mgx B6 magnets with x up to 0.41 and pseudoternary Nd2(Fe1−yMgy)14B compounds with y up to 0.081 have been prepared by conventional powder metallurgy processes. Magnetic measurements indicate that for the magnet alloys i Hc increases as x increases up to 0.25 without a loss in Br, hence the (BH)max values are slightly enhanced. The maximum increase in i Hc is about 15% for x=0.25. Extensive Mg-rich precipitates inside the Nd-rich phase have been observed by electron probe microanalysis (EPMA). Higher Mg intensity at grain boundaries is also detected by EPMA. The reasons for the i Hc increase might be the grain boundary cleaning ability of Mg dopant. For the pseudoternary compounds, the anisotropy field HA is found to increase only slightly due to Mg doping while TC remains practically unchanged.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.342320
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  • 17
    Electronic Resource
    Electronic Resource
    Accurate measurement of the temperature coefficient of the ultrasonic velocity of fused quartz near room temperature (1987)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 58 (1987), S. 1758-1761 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A technique has been adapted to measure the relative change in the acoustic velocity of materials at frequencies up to 500 MHz with a maximum sensitivity of one part in 107. This technique is applied to the measurement of the temperature coefficient of the longitudinal-acoustic velocity of fused quartz over the temperature range 28–47 °C. The longitudinal velocity is observed to increase linearly over this temperature range. The temperature coefficient of the fractional longitudinal velocity increase of fused quartz is determined to be (1.075±0.025)×10−4 °C−1. This number is in agreement with the results of previous investigators and is the most accurate measurement available at room temperature.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1139382
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  • 18
    Electronic Resource
    Electronic Resource
    Fast turbulent correlations from phase coherence velocimetry (1985)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 1831-1832 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Flows with coherent structures allow see-free measurements of local velocity and velocity fluctuations. Continuous turbulent velocity histories in ionizing shock waves are obtained at a 10-MHz sampling rate. From this, correlation profiles and frequency spectra are determined which reveal the presence of prominent high-frequency components.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1138103
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  • 19
    Electronic Resource
    Electronic Resource
    Structure and dynamics in three-component microemulsions (1985)
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 89 (1985), S. 711-713 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/j100250a030
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  • 20
    Electronic Resource
    Electronic Resource
    Structure, interaction, and growth of sodium dodecyl-o-xylenesulfonate micelles in aqueous solutions (1987)
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 91 (1987), S. 1535-1541 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/j100290a049
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