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  • 1985-1989  (8)
Material
Years
Year
  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 1118-1120 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report the electrical chracterization of an InAs/AlAsSb quantum well heterostructure capacitor fabricated on material grown by molecular beam epitaxy. Hysteresis associated with electron storage was observed in the capacitance-voltage data from which we derived exponential charge decay constants of 50 s at 77 K.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 53 (1988), S. 1961-1963 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Both large photoconductive gain and long wavelength photoresponse were observed in lateral photodetectors constructed from type II, InAsSb, strained-layer superlattices. In a novel, four-layer superlattice, gain values as large as 90 are reported with a long wavelength cutoff of 8.7 μm at 77 K. The gain is sensitive to the structure and composition of the superlattice, and the sweepout of minority carriers is eliminated with the appropriate contacts.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 52 (1988), S. 1581-1583 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A photodiode consisting of a p-n junction embedded in an InAs0.09Sb0.91/InSb strained-layer superlattice with equal 130-A(ring)-thick layers was grown using molecular beam epitaxy. This nonoptimized device exhibited photoresponse out to a wavelength of 8.7 μm at 77 K. The resistance and the minority-carrier diffusion length of the photodiode result in a detectivity (3×109 cm Hz1/2/W) at 7 μm that is within one order of magnitude of the detectivity of the best HgCdTe detectors at that wavelength.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: GaAs/In0.2 Ga0.8 As structures with two paralleled 10 nm quantum wells, modulation doped from the top, bottom, and middle with Be, have been fabricated into multiple strained quantum well field-effect transistors (MQWFET's) with 1×150 μm2 Ti/Au gates and examined both illuminated and in the dark at 300 and 77 K. Measurements on van der Pauw structures fabricated simultaneously with the transistors showed hole mobilities and sheet carrier densities to be 200, 3100, and 8040 cm2/V s, and 5.7×1012, 1.8×1012, and 1.5×1012 cm−2 , at 300, 77, and 4 K, respectively. Shubnikov–de Haas measurements made below 4 K verified the existence of a double-channel two-dimensional hole gas with a strain-shifted light-hole ground state in the quantum wells with an effective hole mass of 0.15 me . A representative p-channel MQWFET showed well-saturated common-source output characteristics, both illuminated and unilluminated, at all measurement temperatures. Measured peak extrinsic transconductances and peak saturated drain currents for the unilluminated 1 μm device were 31 and 60 mS/mm and 27 and 67 mA/mm, at 300 and 77 K, respectively.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 6578-6580 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report a study of threshold characteristics of as-grown surface-emitting lasers fabricated with molecular-beam epitaxy by the monolithic integration of two quarter-wave high reflectors (mirrors) of AlAs/Al0.4Ga0.6As surrounding an active spacer layer. The spacer was either a multiple quantum well of GaAs/Al0.4Ga0.6As (100 A(ring)/200 A(ring)) or GaAs. Several structures were grown corresponding to different mirror reflectance and different spacer thicknesses from ultrashort 0.9 to 10 μm. One of the structures was chemically etched to form a two-dimensional array of microlasers. All of the structures were photopumped at room temperature, and the lasing threshold was determined. Without any lateral confinement, the threshold irradiance was as low as 2×105 W/cm2. Near-field images of the light emitted slightly above threshold reveal several competing filaments. This competition broadens the lasing linewidth, but can be controlled by lateral confinement schemes.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 62 (1987), S. 1074-1083 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The addition of Ag to Pd in the gate metal of a metal-insulator-semiconductor gas sensing diode can improve the performance and change the selectivity of the sensors for a variety of reactions. Data on the response of diodes with 12 different ratios of Ag to Pd in alloys and layers of Pd and Ag to hydrogen and other gases are reported. Diodes with as much as 32% Ag respond very well to H2 gas and the films are much more durable to high hydrogen exposure than pure Pd films. Improvements in the rate of response and aging behavior are found for certain Ag combinations; others give poorer performance. The presence of Ag on the surface changes the catalytic activity in some cases and examples of H2 mixed with O2 and/or NO2, propylene oxide, ethylene, and formic acid are given. Such selectivity forms the basis for miniature chemical sensor arrays which could analyze complex gas mixtures.
    Type of Medium: Electronic Resource
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  • 7
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have investigated the properties of Ga(AsP)/GaP strained-layer superlattices (SLSs) that have been doped by implantation of 1×1015/cm2, 75 keV Be+ followed by controlled-atmosphere annealing at 825 °C for 10 min. Our results indicate that doping of these strained-layer superlattices without disordering is a viable process. Liquid-helium temperature photoluminescence suggests a binding energy for the implanted acceptors of 50 meV, consistent with that of beryllium in GaP-based alloys. The implantation-doped regions exhibit room-temperature electrical activation of 15% and hole mobilities of 20 cm2/V s, consistent with the values expected for type-converted GaP-based alloys. SLS diodes fabricated by this process exhibit excellent rectification properties, with a forward turn-on voltage of approximately 1.8 V and low values of room-temperature reverse leakage current densities. Diodes formed from SLSs with original n-type doping of 1×1017/cm3 have typical reverse leakage current densities of 1×10−7 A/cm2 at −10 V, despite the depletion region penetrating approximately ten interfaces of the SLS at this bias. Deep-level transient spectroscopy demonstrates the existence of defect centers, whose densities and signatures are similar to those found in ion-implanted GaP. The implanted photodiodes exhibit a wavelength-dependent photoresponse characteristic of grown-junction SLS photodetectors in the same chemical system. Examination of the spatial response of the photodiodes to a tightly focussed (FWHM=2.45 μm) laser beam at a wavelength of 488 nm indicates that the photoresponse from the device is uniform to within 10% for regions away from the edges of the implanted regions. Modelling of the wavelength-dependent and the spatially dependent photoresponse allows an estimate of minority-carrier diffusion lengths for electrons and holes of 1.0 μm parallel to the SLS layers and 0.1 μm perpendicular to the SLS layers. The excellent electrical and optical properties of the implanted and annealed SLS materials implies additional device applications for these novel materials.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 60 (1986), S. 1131-1134 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have examined the properties of (InGa)As/GaAs strained-layer superlattices (SLSs) that have been disordered by implantation of 5×1015/cm2, 250 keV 64Zn+ followed by controlled atmosphere annealing at 680 °C for 30 min. Ion channeling techniques indicate that the Zn-disordered regions of the SLS contain extensive crystalline damage after annealing. Simulations of the disordering process using an analytic ion range code predict that the electrical junction resulting from the implantation process is located outside the disordered region of the SLS in both the vertical and the lateral directions. Junction electroluminescence intensity for given drive current densities from the Zn-disordered SLS devices is comparable to that from reference Be-implantation-doped (SLS retained) devices and greatly exceeds that from heavily dislocated grown-junction mesa diodes in the homogeneous alloy of the average SLS composition; this result is consistent with the results of the simulations. This study demonstrates that implantation disordering can be as useful for strained-layer systems as for less severely mismatched heterojunction systems.
    Type of Medium: Electronic Resource
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