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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 35 (1984), S. 131-134 
    ISSN: 1432-0630
    Keywords: 66.30.Jt ; 61.70.Tm
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The diffusion coefficients of aluminium have been measured in polycrystalline fcc Pd and Pt. The Al-implanted palladium and platinum samples were annealed at 400°–800 °C and 450°–900 °C, respectively. The aluminium profiles were probed using the nuclear resonance broadening (NRB) technique. Values of (1.41±0.09) and (1.38±0.09) eV for the activation energy and (1.5 −1.0 +5 )×10−6 and (4 −3 +10 )×10−7cm2/s for the frequency factor were obtained for Al in Pd and Pt, respectively. These anomalous results, compared to the “normal impurity diffusion”, were checked using also Al-evaporated samples.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 42 (1987), S. 263-267 
    ISSN: 1432-0630
    Keywords: 66.30.Jt ; 61.70.Tm
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The diffusion coefficients of nitrogen in N-implanted polycrystalline Ni have been deduced. Both bulk and Ni-evaporated samples implanted with nitrogen were annealed at 150–500° C. The nitrogen profiles were probed using the nuclear resonance broadening technique. The value of 0.99±0.12 eV for the activation energy and (3.0 −2.8 +40 )×10−6 cm2/s for the frequency factor were obtained for implanted N in bulk Ni. The solubilities for both the bulk and evaporated Ni samples are given. In evaporated Ni nitrogen migration is enhanced due to the defects arising during evaporation.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 19 (1979), S. 199-203 
    ISSN: 1432-0630
    Keywords: 61.70T ; 61.80J
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract For a systematic prediction of the radiation-enhanced outdiffusion occurring during implantation, the use of a model based on the effect of vacancy flow on diffusion is described. The model agrees reasonably well with experiments in all twentysix measured cases. For the systematic understanding of the radiation enhanced outdiffusion, an approximative diagram based on the activation energy of self-diffusion is constructed for all pure elements and its application possibilities are discussed.
    Type of Medium: Electronic Resource
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