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  • Tl-Ca-Ba-Cu-O  (1)
  • annealing  (1)
  • conducting barriers  (1)
  • 1
    ISSN: 1573-8663
    Keywords: ferroelectric ; rapid thermal annealing ; conducting barriers ; oxidation resistance ; resistance ; oxide electronics
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract We report on the properties of a ferroelectric stack comprising (La0.5Sr0.5)CoO3 (LSCO)/Pb(Nb,Zr,Ti)O3 (PNZT)/LSCO deposited on 4 inch diameter platinized Si wafers (Pt/Ti/SiO2/Si). The LSCO electrodes were deposited at room temperature by pulsed laser ablation and the ferroelectric layer was deposited by the sol-gel technique. Rutherford backscattering was performed to confirm the uniformity in composition, thickness and stoichiometry of LSCO across the wafers. Conventional furnace or rapid thermal annealing was performed to crystallize the electrodes. The oxidation resistance of the conducting barrier layers, Pt/Ti, was found to be dependent on the annealing procedure adopted for the bottom electrode. In the case where the bottom LSCO was crystallized by rapid thermal annealing, Rutherford backscattering analysis and transmission electron microscopy studies revealed that there was no oxidation of the Pt/Ti conducting barrier composite. This is in contrast to the observations for in-situ deposition or conventional furnace annealing of the bottom electrode. The resistivity, coercive field and polarization of the ferroelectric stack were uniform across the 4-inch wafers. The ferroelectric capacitors showed no fatigue up to 1011 cycles and no imprint at 100°C. The ferroelectric properties were independent of the annealing procedure used for crystallizing the electrodes.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1573-8663
    Keywords: manganites ; magnetoresistance ; lattice mismatch ; lanthanum manganate ; strain ; microwaves ; annealing
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract This paper examines the possibility of enhancing the room temperature magnetoresistance at low applied magnetic fields in single layer La0.7 Ba0.3 MnO3 thin films. The influence of lattice mismatch strain, as well as the effect of different frequency regimes, on the magnetoresistance is explored. The effects of lattice mismatch strain are studied by measuring the magnetoresistance as a function of the La0.7 Ba0.3 MnO3 film thickness, oxygen annealing, and lattice matched buffer layers. We find that the release of the lattice mismatch strain improves the magnetoresistance at room temperature and at low magnetic fields. In fact, the highest magnetoresistance at room temperature (−1.7% at 500 Oe) has been found for the 1600  Å as-grown La0.7 Ba0.3 MnO3 film, whereas the largest magnetoresistance (−1.9% at 500 Oe) is found at 309 K for the 1000  Å La0.7 Ba0.3 MnO3 film annealed in flowing O2 for 1 h at 900°C. Finally, we find that the microwave magnetoresistance is the same as the dc magnetoresistance when the cavity corrections are applied. In the single layer La0.7 Ba0.3 MnO3 system, the low field magnetoresistance at room temperature is far from being technologically viable.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1572-9605
    Keywords: Superconductivity ; ac losses ; Y-Ba-Cu-O ; Tl-Ca-Ba-Cu-O
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract We have used a novel bolometric technique and a resonant technique to obtain accurate submillimeter and microwave residual loss data for epitaxial thin films of YBa2Cu3O7, Tl2Ca2Ba2Cu3O10, and Tl2CaBa2Cu2O8. For all films we obtain good agreement between the submillimeter and microwave data, with the residual losses in both the Y-Ba-Cu-O and Tl-Ca-Ba-Cu-O films scaling approximately as frequency squared below ∼1 THz. We are able to fit the losses in the Y-Ba-Cu-O films to a weakly coupled grain model for thea-b plane conductivity, in good agreement with results from a Kramers-Kronig analysis of the loss data. We observe strong phonon structure in the Tl-Ca-Ba-Cu-O films for frequencies between 2 and 21 THz, and are unable to fit these losses to the simple weakly coupled grain model. This is in strong contrast to the case for other high-T c superconductors such as YBa2Cu3O7, where phonon structure observed in ceramic samples is absent in epitaxial oriented films and crystals because of the electronic screening due to the high conductivity of thea-b planes.
    Type of Medium: Electronic Resource
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