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  • balanced filters  (1)
  • evaluation with difference procedure  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Journal of thermal analysis and calorimetry 49 (1997), S. 1025-1037 
    ISSN: 1572-8943
    Keywords: crystallographic evaluation ; evaluation with difference procedure ; kinetics ; Rietveld refinement ; X-ray diffraction ; temperature resolved
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract Time and temperature resolved X-ray diffraction was used for thermal analysis. Series of diffraction patterns were measured, while the samples are heated/cooled stepwise or isothermally with freely selectable temperature programs. The method was applied for the investigation of the phase transitions of ammonium nitrate and HMX (1,3,5,7-tetranitro-1,3,5,7-tetraaza-cyclooctane), when the identification of phases was required. Its capability in the field of kinetics is demonstrated with the isothermal investigation of the solid state reaction of ammonium nitrate with copper oxide and the non-isothermal investigation of the high temperature corrosion of nickel, which was performed by means of a difference procedure. For obtaining structural details peak fitting and Rietveld refinement were applied for the investigation of ammonium nitrate and HMX.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Analog integrated circuits and signal processing 11 (1996), S. 5-19 
    ISSN: 1573-1979
    Keywords: balanced filters ; analogue ; BIST ; fault diagnosis ; ATPG
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract The test and diagnosis of fully differential analogue filters are addressed in this paper. Full coverage of hard/soft faults affecting circuit behaviour can be achieved by adjusting the tolerance window of the built-in self-test circuitry and the amplitude and frequency of the input test signal. Under a single fault assumption, the faulty active or passive component is located and the actual defective value of a faulty passive component is determined. A test generation procedure which results in maximum fault coverage and maximal diagnosis of hard/soft faults in the filter is presented. The test and diagnosis approach can be made compatible with IEEE Std 1149.1 for boundary scan testing.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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