Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
62 (1991), S. 1650-1651
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The operation of a scanning tunneling microscope is based on a feedback using proportional and integral controller. By disturbing a z axis piezo artificially, the optimum feedback parameters for the critically damped response can be readily tuned thus dispensing with the need for exact analytical solutions.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1142449
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