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  • 1
    Electronic Resource
    Electronic Resource
    Substantial diffusion of Zr during solid-state amorphization in Ni/Zr multilayers (1996)
    Springer
    Journal of materials science 7 (1996), S. 47-50 
    Details
    ISSN: 1573-482X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract To examine the proposed model that amorphization is achieved by the motion of one species only, Ni/Zr multilayers have been prepared by sputter deposition at a pressure of 1 Pa. The as-deposited specimen shows the planar and sharp interface between Ni and Zr layers. The amorphous phase is clearly observed at the residual Ni layers and around the void edge in the Zr layer from the cross-sectional TEM images of the samples annealed at 300
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00194092
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Solid-state amorphization behaviour in Ni/Zr multilayers with oxygen contamination (1995)
    Springer
    Journal of materials science 30 (1995), S. 3924-3929 
    Details
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The solid-state amorphization by the interdiffusion reaction in sputter-deposited Ni-Zr multilayer films with oxygen contamination has been investigated by differential scanning calorimetry and X-ray diffractometry. Through X-ray photoelectron spectroscopy analysis, it was found that the multilayer films were contaminated with oxygen during deposition in a low-vacuum system (10−5 torr), and the concentration was modulated having the maximum in zirconium-rich regions. The kinetics of amorphization reactions has been examined by non-isothermal and isothermal annealing. Oxygen introduced into the sample during sample preparation and annealing treatments appears to affect the kinetics of the amorphization reaction associated with variation of the activation energy for interdiffusion in the amorphous layer and a critical thickness of the amorphous layer. The origins of abnormal behaviour in forming intermetallic compound as well as amorphous phase, are discussed in the context of the oxygen incorporation.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01153958
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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