ISSN:
1432-0630
Keywords:
42.10
;
42.20
;
78.20
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract The measurement of reflection and transmission of normally incident light to obtain the optical constants of a material is a usual tool in solid-state spectroscopy. If the material under investigation is a thin film, the interaction of the electromagnetic field with the sample can be enhanced by oblique incidence. If the light is p-polarized, structures in the reflection and transmission spectra are observed at the frequencies of transverse (TO) and longitudinal (LO) resonances. The LO structure — called the Berreman effect — is generated by the surface charges due to the normal component of the electric field. We discuss this effect for three cases: a free film, a film with a metallic back and a substrate with thin films on both sides. The dependence of the effect on the energy-loss function Im {−1/ɛ} and on the film thickness is discussed. For idealized systems simple formulae are derived and a characteristic parameter, called the Berreman thickness, is obtained. Films of this thickness show a maximum effect. Intuitive arguments are given to explain the effect. Examples for the application of the Berreman effect to characterize very thin films are discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00616061
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